Methods and devices for testing a device under test using test site specific control signaling

Abstract

Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communication channels adapted to a specific communication task, without separate signal lines, for example. The bidirectional dedicated real-time handler interface can be used to transmit a synchronization signal or other information to the handler in real-time, and the transmitted signal can be test site specific. The real-time signaling advantageously improves testing accuracy and efficiency.

What is claimed is: 
     
         1 . A handler for testing a device under test (DUT), the handler comprising:
 a circuit; and   a real time tester interface,   wherein the circuit is operable to provide a test site specific signal to an automated test equipment (ATE) via the real time tester interface to test a DUT.   
     
     
         2 . The handler as described in  claim 1 , wherein the test site specific signal comprises a test site specific alarm, and wherein the circuit is further operable to:
 detect a temperature malfunction of the DUT;   perform test site specific alarm handling; and   execute a test site specific shutdown.   
     
     
         3 . The handler as described in  claim 1 , wherein the circuit is further operable to influence data handling of the DUT by the ATE using the test site specific signal via the real time tester interface. 
     
     
         4 . The handler as described in  claim 1 , wherein the test site specific signal comprises:
 test site identification information; and   regulation information, and   wherein the test site identification information associates a specific test site with the regulation information.   
     
     
         5 . The handler as described in  claim 4 , wherein the test site identification information comprises a test site ID modulated onto the test site specific signal. 
     
     
         6 . The handler as described in  claim 4 , wherein the regulation information comprises at least one of: timing information; control amplitude information; and control duration information. 
     
     
         7 . Automated test equipment (ATE) for testing a device under test, the ATE comprising:
 a processor; and   a real time handler interface,   wherein the real time handler interface is operable to receive a test site specific signal from a handler to test a DUT coupled to the handler using the processor.   
     
     
         8 . The ATE as described in  claim 7 , wherein the test site specific signal comprises a test site specific alarm, and wherein the processor is operable to handle the test site specific alarm. 
     
     
         9 . The ATE as described in  claim 8 , wherein the processor is further operable to perform a test site specific shutdown based on the test site specific alarm. 
     
     
         10 . The ATE as described in  claim 7 , wherein the processor is operable to influence data handling of the device under test in response to a signal received from the handler. 
     
     
         11 . The ATE as described in  claim 7 , wherein the test site specific signal comprises: 
 test site identification information; and   regulation information, and wherein the test site identification information associates a specific test site with the regulation information.   
     
     
         12 . The ATE as described in  claim 11 , wherein the test site identification information comprises a test site ID modulated onto the test site specific signal. 
     
     
         13 . The ATE as described in  claim 11 , wherein the regulation information comprises at least one of: timing information; control amplitude information; and control duration information. 
     
     
         14 . A method of testing a device under test (DUT), the method comprising:
 providing a test site specific signal to an automated test equipment (ATE) via a real time tester interface; and   testing the DUT according to the test site specific signal.   
     
     
         15 . The method as described in  claim 14 , wherein the test site specific signal comprises a test site specific alarm, and wherein the method further comprises performing a test site specific shutdown based on the test site specific alarm. 
     
     
         16 . The method as described in  claim 14 , further comprising influencing data handling of the DUT in response to the test site specific signal. 
     
     
         17 . The method as described in  claim 14 , wherein the test site specific signal comprises:
 test site identification information; and   regulation information, and wherein the test site identification information associates a specific test site with the regulation information.   
     
     
         18 . A method of testing a device under test (DUT), the method comprising:
 receiving a test site specific signal from a handler via a real time tester interface; and   testing a DUT coupled to the handler according to the test site specific signal.   
     
     
         19 . The method as described in  claim 18 , wherein the test site specific signal comprises a test site specific alarm, and wherein the method further comprises performing a test site specific shutdown based on the test site specific alarm. 
     
     
         20 . The method as described in  claim 18 , wherein the test site specific signal comprises:
 test site identification information; and   regulation information, and wherein the test site identification information associates a specific test site with the regulation information.