Methods and devices for testing a device under test using a bidirectional real-time interface
Abstract
Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communication channels adapted to a specific communication task, without separate signal lines, for example. The bidirectional dedicated real-time handler interface can be used to transmit a synchronization signal or other information to the handler in real-time, and the transmitted signal can be test site specific. The real-time signaling advantageously improves testing accuracy and efficiency.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . Automated test equipment for testing a device under test (DUT), the automated test equipment comprising:
a test computer; a bidirectional dedicated real-time handler interface operable to provide a trigger signal to a handler for triggering a temperature control function of the handler during testing of the DUT, wherein the bidirectional dedicated real-time handler interface is operable to receive a signal from the handler, and wherein the test computer is operable to analyze the signal from the handler, and provide, via the real-time handler interface, a synchronization signal to the handler for synchronizing an operation with the handler.
2 . The automated test equipment as described in claim 1 , wherein the bidirectional dedicated real-time handler interface is operable to provide a test site specific signal to the handler to control the temperature control function.
3 . The automated test equipment as described in claim 1 , wherein the signal received from the handler comprises a test site specific signal.
4 . The automated test equipment as described in claim 1 , wherein the bidirectional dedicated real-time handler interface is further operable to transmit an additional signal to the handler, the additional signal comprising at least one of: control information pertaining to a temperature control profile or to temperature regulation performed by the handler; information pertaining to a value measured by the automated test equipment; a test state parameter; and alarm information.
5 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to modify a test flow for testing the DUT based on the signal received from the handler.
6 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to operable to receive a deactivation signal from the handler.
7 . The automated test equipment as described in claim 6 , wherein the test computer is further operable to operable to interrupt testing of the DUT in response to the deactivation signal.
8 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to receive a temperature warning signal from the handler.
9 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to interrupt testing of a test site in response to receiving a test site specific signal from the handler.
10 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to deactivate a power supply of the DUT in response to receiving the signal from the handler.
11 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to modify data handling of the DUT in response to receiving the signal from the handler.
12 . The automated test equipment as described in claim 1 , wherein the test computer is further configured to log the signal received from the handler in memory.
13 . The automated test equipment as described in claim 1 , wherein the test computer is further operable to react to the signal received from the handler in real-time.
14 . A handler for testing a device under test (DUT) using an automated test equipment, the handler comprising:
a bidirectional real-time tester interface; and a circuit, wherein the bidirectional real-time tester interface is operable to cause the circuit to:
receive a trigger signal from the automated test equipment via the bidirectional real-time tester interface;
trigger a temperature control function in response to the received signal; and
provide another signal to the automated test equipment via the bidirectional real-time tester interface.
15 . The handler as described in claim 14 , wherein the bidirectional real-time tester interface is further operable to cause the circuit to:
receive a synchronization signal from the automated test equipment; and synchronize a function with the automated test equipment, other than the temperature control function, in response to the received synchronization signal.
16 . The handler as described in claim 14 , wherein the bidirectional dedicated real-time tester interface is further operable to cause the circuit to:
receive a test site specific signal from the automated test equipment; and control the temperature control function in response to the received test site specific signal.
17 . A method of testing a device under test (DUT), the method comprising:
transmitting a trigger signal to a handler via a bidirectional real-time handler interface to trigger a temperature control function; receiving a signal from the handler via the bidirectional real-time handler interface; and analyzing the signal received from the handler.
18 . The method of claim 17 , wherein the bidirectional real-time handler is dedicated, and further comprising transmitting an additional signal to the handler, the additional signal comprising at least one of: control information pertaining to a temperature control profile or to temperature regulation performed by the handler; information pertaining to a value measured by the automated test equipment; a test state parameter; and alarm information.
19 . The method of claim 17 , wherein the bidirectional real-time handler is dedicated, and wherein the trigger signal comprises a test site specific signal, and wherein further the handler is configured to control the temperature control function in response to the received test site specific signal.
20 . The method of claim 17 , wherein the bidirectional real-time handler is dedicated, and further comprising:
transmitting a synchronization signal to the handler via the bidirectional real-time tester interface; and synchronizing a function with the handler, other than the temperature control function, using the synchronization signal.Join the waitlist — get patent alerts
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