Quality control method for sensor and sensor array production

Abstract

A process of making sensors and sensor arrays that provided real time notification of any centerline deviation. Such production process can be adjusted in real time. Thus, large numbers of units can be made—even in millions of per day—with few if any out of specification units being produced. Such process does not require large-scale clean rooms and is easily configurable.

What is claimed is: 
     
         1 . A process of making a sensor or sensor array comprising:
 a.) pattern illumination-based annealing a coated substrate comprising a substrate having a first side and a second side,
 (i) said substrate's first side comprising; one or more coatings of patterned electrical conductive material disposed over said substrate's first side, said patterned electrical conductive material comprising a material selected from the group consisting of poly(3,4-ethylenedioxythiophene), poly(3,4-ethylenedioxythiophene) polystyrene sulfonate, poly(pyrrole), polycarbazoles, polyindoles, polyazepines, Cr, Mo, Ti, Sc, Ni, V, Hf, W, Nb, Au, Ag, Cu, and Pt and mixtures thereof; and one or more chemical coatings disposed over said one or more coatings of patterned electrical conductive material, said one or more chemical coatings each independently comprising a transition metal and an element selected from the group consisting of hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof, said one or more chemical coatings each independently comprising at least one of an amorphous, nanocrystalline, microcrystalline or crystalline region; 
 (ii) said substrate's second side optionally comprising one or more coatings of patterned electrical conductive material disposed over said substrate's first side, said patterned electrical conductive material comprising a material selected from the group consisting of poly(3,4-ethylenedioxythiophene), poly(3,4-ethylenedioxythiophene) polystyrene sulfonate, poly(pyrrole), polycarbazoles, polyindoles, polyazepines, Cr, Mo, Ti, Sc, Ni, V, Hf, W, Nb, Au, Ag, Cu, and Pt and mixtures thereof; said one or more chemical coatings each independently comprising a transition metal and an element selected from the group consisting of hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof, said one or more chemical coatings each independently comprising at least one of an amorphous, nanocrystalline, microcrystalline or crystalline region; 
   said pattern illumination-based annealing comprising using one or more lasers and/or lamps to achieve at least one of a chemical change or structural change in at least a portion of at least one of said one or more chemical coatings on at least one side of said substrate, and optionally the removal of at least a portion of said chemical coating on at least one side of said substrate;   b.) optionally, attaching one or more types of functional molecules and/or one or more complexes comprising one or more types of functional molecules and one or more target molecules to at least a portion of said pattern illumination-based anneal coated substrate, said one or types of biomaterial being attached to:
 (i) a pattern illumination-based annealed portion of said pattern illumination-based anneal coated substrate; 
 (ii) a portion of said pattern illumination-based anneal coated substrate that is not pattern illumination-based annealed; or 
 (iii) a portion of said pattern illumination-based anneal coated substrate that is not pattern illumination-based annealed and a portion of said pattern illumination-based anneal coated substrate that is pattern illumination-based annealed; 
   said process being a roll process wherein said coated chemically substrate is a rolled coated chemically substrate that is unrolled at least in part, said unrolled chemical coating portion of said coated substrate being at least in part pattern illumination-based annealed, said process comprising a quality control unit comprising one or more diagnostic detectors, said one or more diagnostic detectors positioned to collect light that has interacted with said one or more chemical coatings at the point of and/or after said pattern illumination-based annealing has occurred.   
     
     
         2 . A process of making a sensor according to  claim 1  wherein said one or more diagnostic detectors are each independently an optical camera, an optical detector, or Raman spectrometer. 
     
     
         3 . A process of making a sensor according to  claim 1  wherein said quality control unit comprises at least two diagnostic detectors, at least one of said diagnostic detectors positioned to collect light that has interacted with said one or more chemical coatings at the point of said pattern illumination-based annealing and at least one of said diagnostic detectors positioned to collect light that has interacted with said one or more chemical coatings after said pattern illumination-based annealing has occurred. 
     
     
         4 . A process of making a sensor according to  claim 1  wherein said collected light that has interacted with said one or more chemical coatings at the point of and/or after said pattern illumination-based annealing has occurred is suppled prior to said interaction by a laser, an LED or a broadband light source. 
     
     
         5 . A process of making a sensor according to  claim 1  wherein at least a portion of said collected light that has interacted with said one or more chemical coatings at the point of and/or after said pattern illumination-based annealing has occurred is suppled prior to said interaction by said one or more lasers and/or lamps used to achieve at least one of a chemical change or structural change in at least a portion of at least one of said one or more chemical coatings on at least one side of said substrate. 
     
     
         6 . A process of making a sensor according to  claim 1  wherein said one or more functional molecules are biomaterials is selected from the group consisting of peptides, nanozymes, proteins, lipids, carbohydrates and lectins, nucleic acids and mixtures thereof. 
     
     
         7 . A process of making a sensor according to  claim 1  wherein said biomaterial's attachment to said pattern illumination-based anneal coated substrate comprises at least one of a covalent bond, electrostatic bond or a covalent and electrostatic bond. 
     
     
         8 . A process of making a sensor according to  claim 1  wherein said attaching said biomaterial's to said pattern illumination-based anneal coated substrate comprises contacting said at least a portion of said pattern illumination-based anneal coated substrate and said one or more types of biomaterials. 
     
     
         9 . A process of making a sensor according to  claim 1  wherein:
 a) at least one of said one or more chemical coatings comprises two or more regions that are amorphous, nanocrystalline, microcrystalline or crystalline with the proviso that at least two of said regions are not identical with respect to being amorphous, nanocrystalline, microcrystalline or crystalline and said laser or lamp forms on, within or on and within said at least one of said one or more chemical coatings:
 (i) at least two electronic elements selected from a conductor, semiconductor and an insulator; 
 (ii) two or more different conductors having at least one of the following: different electrical properties or different optical properties; 
 (iii) two or more different semiconductors having at least one of the following: different electrical properties or different optical properties; or 
 (iv) two or more different insulators having at least one of the following: different electrical properties or different optical properties; 
 
  said process being performed under one of the following conditions: vacuum of less 100 torr, air or under a fluid blanket other than air; 
  said pattern illumination-based annealing resulting in at least one of a chemical change or structural change, and the removal of at least a portion of at least one of said one or more chemical coatings and resulting in an electrical component, an optical component or a combined electrical and optical component being formed on, within or on and within at least a portion of said pattern illumination-based annealed one or more chemical coatings; or 
 b) at least one of said one or more chemical coatings comprises at least one region that is amorphous, nanocrystalline, microcrystalline or crystalline, and said one or more lasers and/or lamps forms on, within or on and within said at least one of said one or more chemical coatings:
 (i) at least two electronic elements selected from a conductor, semiconductor and an insulator; 
 (ii) two or more different conductors having at least one of the following: different electrical properties or different optical properties; 
 (iii) two or more different semiconductors having at least one of the following: different electrical properties or different optical properties; or 
 (iv) two or more different insulators having at least one of the following: different electrical properties or different optical properties; 
 
  said process being performed under one of the following environmental conditions: vacuum of less 100 torr, air or under a fluid blanket other than air, then repeating, one or more times said pattern illumination-based annealing on said portion of said one or more chemical coatings using one or more of the following:
 (i) the same device but at least one of the following: a different intensity or time; 
 (ii) a different environmental condition from the previous environmental condition, said different environmental condition select from the same group of environmental conditions; or 
 (iii) a lamp if the previous pattern illumination-based annealing was laser pattern illumination-based annealing or a laser if the previous pattern illumination-based annealing was lamp pattern illumination-based annealing 
 
  said pattern illumination-based annealing resulting in at least one of a chemical change or structural change, and the removal of at least a portion of at least one of said one or more chemical coatings and resulting in an electrical component, an optical component or a combined electrical and optical component being formed on, within or on and within at least a portion of said pattern illumination-based annealed one or more chemical coatings. 
 
     
     
         10 . The process of  claim 9  wherein for element 5b) said at least one chemical coating comprises two or more regions that are amorphous, nanocrystalline, microcrystalline or crystalline with the proviso that at least two of said regions are not identical with respect being amorphous, nanocrystalline, microcrystalline or crystalline, at least two of said regions being pattern illumination-based annealed via different pattern illumination-based annealing processes. 
     
     
         11 . The process of  claim 1  wherein said transition metal is selected from the group consisting of molybdenum, tungsten, niobium, tantalum, vanadium, titanium, chromium, iron, rhodium, hafnium, rhenium and mixtures thereof. 
     
     
         12 . The process of  claim 1  wherein said process is performed under a fluid blanket other than air. 
     
     
         13 . The process of  claim 1  wherein said fluid blanket comprises:
 a) an element selected from the group consisting of krypton, xenon, radon, argon, neon, helium, hydrogen, carbon, nitrogen, oxygen, sulfur, selenium, phosphorous and mixtures thereof; 
 b) based on total fluid volume greater than 0% to about 19% or from 21% to 100% oxygen; and/or 
 c) greater than 0% to about 78% or from 80% to 100% nitrogen. 
 
     
     
         14 . A process according to  claim 1  wherein said material comprises at least one region that is amorphous or nanocrystalline. 
     
     
         15 . A process according to  claim 1  wherein said pattern illumination-based annealing is achieved by using one or more lasers , said one or more lasers each being independently selected from a laser that is a pulsed laser, a continuous laser or a pulsed/continuous laser. 
     
     
         16 . A process according to  claim 1  wherein said pattern illumination-based annealing is achieved by using a continuous wave laser to subject at least a portion of said chemical coating, for a time of about 0.001 milliseconds to 60 seconds to said continuous laser; said continuous laser having power of from about 1 microwatt to about 1 megawatt over the time period said at least a portion of said chemical coating is subjected to said continuous laser. 
     
     
         17 . A process according to  claim 1  wherein said pattern illumination-based annealing is achieved by using a lamp to subject at least a portion of said chemical coating for a time of about 10 microseconds to about 500,000 microseconds to said lamp, said lamp having power of from about 0.01 J/cm 2 to about 1,000 J/cm 2 . 
     
     
         18 . A process according to  claim 1  wherein said pattern illumination-based annealing is achieved by using a pulsed laser to subject at least a portion of said chemical coating for a time of about 0.1 femtoseconds to 60 seconds to said pulsed laser; said pulsed laser having a peak power of from about 0.1 microwatt to about 1000 gigawatts over the time period said at least a portion of said chemical coating is subjected to said pulsed laser; said pulsed laser having a pulse period of about 0.1 femtoseconds to 1 second. 
     
     
         19 . The process of  claim 1  wherein, said each chemical coating independently has a thickness of from about 0.1 nanometers to about 1 centimeter. 
     
     
         20 . The process of  claim 1  wherein, said electrical and/or optical component is selected from the group consisting of an inductor, a capacitor, a resistor, a diode, a transistor, a trace, a battery, an optical filter, a chemical sensor, a biological sensor and a solar cell. 
     
     
         21 . The process of  claim 1  wherein each of said one or more chemical coatings have an area and a thickness and said removal of said at least a portion of said one or more chemical coating occurs, said removal comprising at least one of:
 a.) laser ablation removal of from about 0.1% to about 99.9% of at least one of said one or more chemical coatings' area; or 
 b.) laser ablation removal of at least 85% of at least one of said chemical coatings' thickness; or laser ablation removal of about 85% to about 99% of at least one of said chemical coatings' thickness. 
 
     
     
         22 . The process of  claim 1  wherein said substrate of said coated substrate is selected from glass, polymer and mixtures thereof. 
     
     
         23 . The process of  claim 1  wherein at least a portion of said coated substrate's pattern illumination-based annealed chemical coating is further treated by at least one of the following processes:
 a.) two or more pattern illumination-based annealings; 
 b.) plasma treatment comprising exposing said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating to an ionized gas derived from the group consisting of He, Ne, Ar, Kr, Xe, Hz, O 2 , SF 6 , CF 4 , N 2  and mixtures thereof;
 (i) said plasma treatment being conducted at a pressure of from about 0.1 mTorr to about 1000 Torr; 
 (ii) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's plasma treatment temperature being from about 0° C. to about 1,500° C.; and 
 (iii) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating exposure time being from about 0.001 seconds to about 10,000,000 seconds; 
 
 c.) ion beam irradiation comprising exposing said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating to an ion beam, said ion beam comprising an ionized gas derived from the group consisting of He, Ne, Ar, Kr, Xe, H 2 , O 2 , SF 6 , CF 4 , N 2  and mixtures thereof;
 (i) said ion beam having an incident ion energy of from about 50 eV to about 10,000 eV; 
 (ii) said ion beam having an incoming ion species incident angle of from about 1° to 90°, relative to the surface being bombarded; 
 (iii) said ion beam having an incident ion flux of from about 0.1 nA/mm 2  to about 900,000,000 nA/mm 2 ; 
 (iv) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's ion beam irradiation treatment temperature being from about 0° C. to about 1,500° C.; and 
 (v) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's ion beam irradiation exposure time to said ion beam being from about 0.001 seconds to about 10,000,000 seconds; 
 
 d.) electron beam illumination comprising at least a portion of said coated substrate's pattern illumination-based annealed chemical coating to an electron dose of from about 10 2  electrons/nm 2  to about 10 25  electrons/nm 2  by exposing said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating to:
 (i) to an electron beam having an incident electron energy of from about 0.1 eV to about 100,000,000 eV; 
 (ii) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's electron beam illumination exposure time to said electron beam illumination being from about 0.001 seconds to about 10,000,000 seconds; 
 (iii) said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's electron beam illumination treatment temperature being from about 0° C. to about 1,500° C.; 
 
 e.) thermal annealing said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating, said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating's thermal annealing treatment temperature being from about 0° C. to about 1,500° C.; 
 f.) chemically etching said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating comprising contacting said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating with an etching composition; 
 g.) electro-chemically treating said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating by contacting said at least a portion of said coated substrate's pattern illumination-based annealed chemical coating with a chemical composition comprising an electrolyte and subjecting said contacted at least a portion of said coated substrate's pattern illumination-based annealed chemical coating and said chemical composition comprising an electrolyte to an electrical current; 
 h.) surface physical modification of at least a portion of said coated substrate's pattern illumination-based annealed chemical coating.