US2023115136A1PendingUtilityA1
Laminated substrate having piezoelectric film, element having piezoelectric film and method for manufacturing this laminated substrate
Est. expiryJul 12, 2037(~11 yrs left)· nominal 20-yr term from priority
H10N 30/8542H03H 2003/028H03H 9/02031H03H 9/171H10N 30/076H03H 9/02015H10N 30/05H03H 9/02574H03H 3/08H01L 41/0805H01L 41/1873H01L 41/27H10N 30/708H10N 30/704
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Claims
Abstract
There is provided a laminated substrate having a piezoelectric film, including: a substrate; and a piezoelectric film provided on the substrate interposing a base film, wherein the piezoelectric film has an alkali niobium oxide based perovskite structure represented by a composition formula of (K 1-x Na x )NbO 3 (0<x<1) and preferentially oriented in (001) plane direction, and a sound speed of the piezoelectric film is 5100 m/s or more.
Claims
exact text as granted — not AI-modified1 . A laminated substrate having a piezoelectric film, comprising:
a substrate; and a piezoelectric film on the substrate interposing a base film, wherein a sound speed of the piezoelectric film is 5100 m/s or more, and an absolute value |d 31 | of a piezoelectric constant of the piezoelectric film is 90 pm/V or more.
2 . The laminated substrate having a piezoelectric film according to claim 1 , wherein the piezoelectric film has an alkali niobium oxide based perovskite structure represented by a composition formula of (K 1 - x Na x )NbO 3 , wherein 0<x<1, and preferentially oriented in (001) plane direction.
3 . The laminated substrate having a piezoelectric film according to claim 1 , wherein the piezoelectric film contains an element of Cu, Mn, Li, Ta, or Sb in a range of 5 at% or less.
4 . A piezoelectric film element comprising the substrate having a piezoelectric film according to claim 1 and an electrode film provided on the piezoelectric film.
5 . The piezoelectric film element according to claim 4 , wherein the piezoelectric film has an alkali niobium oxide based perovskite structure represented by a composition formula of (K 1 - x Na x )NbO 3 , where 0<x<1, and preferentially oriented in (001) plane direction.
6 . The piezoelectric film element according to claim 4 , wherein the piezoelectric film contains an element of Cu, Mn, Li, Ta, or Sb in a range of 5 at% or less.
7 . A method for manufacturing the laminated substrate having a piezoelectric film according to claim 1 , the method comprising:
forming a piezoelectric film on a substrate interposing a base film, wherein a sound speed of the piezoelectric film is 5100 m/s or more, and an absolute value |d 31 | of a piezoelectric constant of the piezoelectric film is 90 pm/V or more.
8 . The method according to claim 7 , wherein the piezoelectric film has an alkali niobium oxide based perovskite structure represented by a composition formula of (K 1-x Na x )NbO 3 , where 0<x<1, and preferentially oriented in (001) plane direction.
9 . The method according to claim 7 , wherein the piezoelectric film contains an element of Cu, Mn, Li, Ta, or Sb in a range of 5 at% or less.Join the waitlist — get patent alerts
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