US2023061699A1PendingUtilityA1

Upper electrode and plasma processing apparatus

Assignee: TOKYO ELECTRON LTDPriority: Jul 17, 2012Filed: Nov 8, 2022Published: Mar 2, 2023
Est. expiryJul 17, 2032(~6 yrs left)· nominal 20-yr term from priority
C23C 4/04H01J 37/3244C23C 4/12H01J 37/32568H01J 37/3255H01J 37/32532C23C 4/11
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Claims

Abstract

In an exemplary embodiment, an upper electrode is disposed in a processing chamber to face a susceptor and provided with a plate-like member and an electrode part. In an exemplary embodiment, the plate-like member is formed with a gas distribution hole that distributes a processing gas used for a plasma processing. The electrode part is formed in a film shape by thermally spraying silicon onto a surface of the plate-like member where an outlet of the gas distribution hole is formed.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . An upper electrode comprising:
 a plate-like member provided with a flow path that distributes a processing gas used for a plasma processing; and   an electrode part formed in a film shape by thermally spraying silicon onto a surface the plate-like member where an outlet of the flow path is formed.   
     
     
         2 . The upper electrode of  claim 1 , wherein a resistivity of a peripheral portion of the electrode part and a resistivity of a central portion of the electrode part are set to different values by adjusting film thicknesses of the silicon in the peripheral portion of the electrode part and in the central portion of the electrode part. 
     
     
         3 . The upper electrode of  claim 2 , wherein the resistivity of the peripheral portion of the electrode part and the resistivity of the central portion of the electrode part are set to different values within a range of 0.01 mΩcm to 100 Ωcm. 
     
     
         4 . A plasma processing apparatus comprising:
 a processing container configured to define a plasma processing space;   a lower electrode provided in the processing container and configured to place a substrate to be processed thereon; and   an upper electrode disposed to face the lower electrode across the plasma processing space,   wherein the upper electrode includes:   a plate-like member provided with a flow path that distributes a processing gas used for a plasma processing; and   an electrode part formed in a film shape by thermally spraying silicon onto a surface of the plate-like member where an outlet of the flow path is formed.

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