US2023057803A1PendingUtilityA1

Semiconductor device with redistribution layers on partial encapsulation and non-photosensitive passivation layers

Assignee: AMKOR TECH SINGAPORE HOLDING PTE LTDPriority: Jul 19, 2013Filed: Aug 19, 2022Published: Feb 23, 2023
Est. expiryJul 19, 2033(~7 yrs left)· nominal 20-yr term from priority
H10W 74/142H10W 72/9415H10W 72/942H10W 72/922H10W 72/29H10W 72/9413H10W 70/65H10W 72/012H10W 72/252H10W 72/241H10W 72/244H10W 72/242H10W 72/234H10W 72/232H10W 74/117H10W 74/129H10W 72/019H10W 74/019H10W 70/05H10W 90/701H10W 74/141H10W 70/635H10P 14/20H01L 2224/02317H01L 2224/13024H01L 2224/02372H01L 23/3128H01L 23/3114H01L 23/49816H01L 24/05H01L 24/13H01L 24/03H01L 23/49827H01L 24/11H01L 23/3185H01L 21/568H01L 23/49838
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Claims

Abstract

A semiconductor device with redistribution layers on partial encapsulation is disclosed and may include providing a carrier with a non-photosensitive protection layer, forming a pattern in the non-photosensitive protection layer, providing a semiconductor die with a contact pad on a first surface, and bonding the semiconductor die to the non-photosensitive protection layer such that the contact pad aligns with the pattern formed in the non-photosensitive protection layer. A second surface opposite to the first surface of the semiconductor die, side surfaces between the first and second surfaces of the semiconductor die, and a portion of a first surface of the non-photosensitive protection layer may be encapsulated with an encapsulant. The carrier may be removed leaving the non-photosensitive protection layer bonded to the semiconductor die. A redistribution layer may be formed on the contact pad and a second surface of the non-photosensitive protection layer opposite to the first surface.

Claims

exact text as granted — not AI-modified
1 . A method for manufacturing a semiconductor device, the method comprising:
 forming a pattern in a non-photosensitive protection layer;   providing a semiconductor die with a contact pad on a first surface;   bonding the semiconductor die to the non-photosensitive protection layer;   encapsulating a second surface opposite to the first surface of the semiconductor die; and   forming a redistribution layer on the contact pad and the non-photosensitive protection layer opposite to the first surface.   
     
     
         2 - 20 . (canceled)

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