Quality Control of High Performance Superconductor Tapes

Abstract

A superconductor tape and method for manufacturing, measuring, monitoring, and controlling same are disclosed. Embodiments are directed to a superconductor tape which includes a superconductor film overlying a buffer layer which overlies a substrate. In one embodiment, the superconductor film is defined as having a c-axis lattice constant higher than 11.74 Angstroms. In another embodiment, the superconductor film comprises BaMO3, where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO3 elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconductor film. These and other embodiments achieve well-aligned nanocolumnar defects and thus a high lift factor, which can result in superior critical current performance of the tape in, for example, high magnetic fields.

What is claimed is: 
     
         1 . A method of measuring a c-axis lattice parameter of a superconductor film in a superconductor tape, the method comprising:
 providing a superconductor tape comprising:
 a substrate; 
 a buffer layer overlying the substrate; and 
 a superconductor film deposited over the buffer layer; 
   measuring the c-axis lattice parameter of the superconductor film via in-line X-ray Diffraction in real-time subsequent the deposition of the superconductor film over the buffer layer.   
     
     
         2 . The method of  claim 1 , wherein the superconductor film is over 10 meters in length. 
     
     
         3 . The method of  claim 1 , wherein the superconductor film comprises 5 to 30 mol % of dopant selected from the group consisting of Zr, Sn, Ta, Nb, Hf, Ce, and a combination thereof 
     
     
         4 . The method of  claim 1 , wherein the c-axis lattice parameter is a c-axis lattice constant higher than 11.74 Angstroms. 
     
     
         5 . The method of  claim 1 , wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO3 elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconductor film. 
     
     
         6 . The method of  claim 1 , wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3  located at a 2 theta angle higher than 30° when measured by X-ray Diffraction using copper k alpha radiation. 
     
     
         7 . The method of  claim 1 , wherein the superconductor film comprises BaMO3, where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3  located at a 2 theta angle less than 2.6° from the (103) peak of the superconductor phase when measured by X-ray Diffraction using copper k alpha radiation. 
     
     
         8 . A method of measuring the (101) X-ray Diffraction peak of BaMO 3  in a superconductor film in a superconductor tape, the method comprising:
 providing a superconductor tape comprising:
 a substrate; 
 a buffer layer overlying the substrate; and 
 a superconductor film deposited over the buffer layer; 
 wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce; and 
   measuring the (101) X-ray Diffraction peak of BaMO 3  via in-line X-ray Diffraction in real-time subsequent the deposition of the superconductor film over the buffer layer.   
     
     
         9 . The method of  claim 8 , wherein the superconductor film is over 10 meters in length. 
     
     
         10 . The method of  claim 8 , wherein the superconductor film comprises 5 to 30 mol % of dopant selected from the group consisting of Zr, Sn, Ta, Nb, Hf, Ce, and a combination thereof 
     
     
         11 . The method of  claim 8 , wherein the superconductor film is defined as having a c-axis lattice constant higher than 11.74 Angstroms. 
     
     
         12 . The method of  claim 8 , wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3  elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconductor film. 
     
     
         13 . The method of  claim 8 , wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3  located at a 2 theta angle higher than 30° when measured by X-ray Diffraction using copper k alpha radiation. 
     
     
         14 . The method of  claim 8 , wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3  located at a 2 theta angle less than 2.6° from the (103) peak of the superconductor phase when measured by X-ray Diffraction using copper k alpha radiation. 
     
     
         15 . A method of measuring the X-ray Diffraction peak of RE 2 O 3  in a superconductor film in a superconductor tape, the method comprising:
 providing a superconductor tape comprising:
 a substrate; 
 a buffer layer overlying the substrate; and 
 a superconductor film deposited over the buffer layer; 
 wherein the superconductor film comprises RE 2 O 3 , where RE=rare earth; and 
   measuring the X-ray Diffraction peak of RE 2 O 3  via in-line X-ray Diffraction in real-time subsequent the deposition of the superconductor film over the buffer layer.   
     
     
         16 . The method of  claim 15 , wherein the superconductor film is over 10 meters in length.