Pure copper plate
Abstract
This pure copper plate or sheet contains 99.96% by mass or greater of Cu, in which when an average crystal grain size of crystal grains in a rolled surface is represented by X μm and an amount of Ag is represented by Y mass ppm, an expression of 1×10−8≤X−3Y−1≤1×10−5 is satisfied, and when a ratio of J3, in which all three grain boundaries constituting a grain boundary triple junction are special grain boundaries, to all grain boundary triple junctions is defined as NFJE and a ratio of J2, in which two grain boundaries constituting a grain boundary triple junction are special grain boundaries and one grain boundary constituting the grain boundary triple junction is a random grain boundary, to all grain boundary triple junctions is defined as NFJ2, an expression of 0.30<(NFJ2/(1−NFJ3))0.5≤0.48 is satisfied.
Claims
exact text as granted — not AI-modified1 . A pure copper plate or sheet comprising:
99.96% by mass or greater of Cu, wherein when an average crystal grain size of crystal grains in a rolled surface is represented by X μm and an amount of Ag is represented by Y mass ppm, a relational expression of 1×10 −8 ≤X −3 Y −1 ≤1×10 −5 is satisfied, a surface orthogonal to a rolling width direction is used as an observation surface, measurement regarding a matrix is performed on a measurement area of 10000 μm 2 or greater at every measurement intervals of 0.25 μm by an EB SD method, measured results are analyzed by data analysis software OIM to obtain a CI value in each measurement point, a measurement point in which a CI value is 0.1 or less is removed, an orientation difference between crystal grains is analyzed, a boundary having 15° or more of an orientation difference between neighboring measuring points is assigned as a grain boundary, an average grain size A is acquired according to Area Fraction, measurement regarding the matrix is performed at every measurement intervals which are 1/10 or less of the average grain size A by the EBSD method, measured results are analyzed by the data analysis software OIM with a measurement area of 10000 μm 2 or greater in a plurality of visual fields such that a total of 1000 or more crystal grains are included to obtain a CI value in each measurement point, a measurement point in which a CI value is 0.1 or less is removed, an orientation difference between crystal grains is analyzed, and a boundary having 15° or more of an orientation difference between neighboring measuring points is assigned as a grain boundary, a coincidence boundary with Σ29 or less is defined as a special grain boundary, and the other grain boundaries are defined as random grain boundaries, in grain boundary triple junctions analyzed by the OIM, when a ratio of J3, in which all three grain boundaries constituting a grain boundary triple junction are special grain boundaries, to all grain boundary triple junctions is defined as NF J3 and a ratio of J2, in which two grain boundaries constituting a grain boundary triple junction are special grain boundaries and one grain boundary constituting the grain boundary triple junction is a random grain boundary, to all grain boundary triple junctions is defined as NF J2 , an expression of 0.30<(NET2/(1−NF J3 )) 0.5 ≤0.48 is satisfied.
2 . The pure copper plate or sheet according to claim 1 , further comprising:
Mg, and Sn wherein a total amount of Mg and Sn is in a range of 0.1 mass ppm or greater and 100 mass ppm or less.
3 . The pure copper plate or sheet according to claim 1 , further comprising:
Sn wherein an amount of S is in a range of 1 mass ppm or greater and 20 mass ppm or less.
4 . The pure copper plate or sheet according to claim 1 , further comprising:
Pb; Se; and Te, wherein a total amount of Pb, Se, and Te is in a range of 0.3 mass ppm or greater and 10 mass ppm or less.
5 . The pure copper plate or sheet according to claim 1 , further comprising:
Sr; Ba; Ti; Zr; Hf; and Y, wherein a total amount of Sr, Ba, Ti, Zr, Hf, and Y is 10 mass ppm or less.
6 . The pure copper plate or sheet according to claim 1 , further comprising:
Al; Cr; P; Be; Cd; Ni; and Fe, wherein a total amount of Al, Cr, P, Be, Cd, Ni, and Fe is in a range of 0.3 mass ppm or greater and 10 mass ppm or less.
7 . The pure copper plate or sheet according to claim 1 , wherein
a ratio d max /d ave of a maximum crystal grain size d max to an average crystal grain size d ave in a range of 50 mm×50 mm after a heat treatment maintained at 800° C. for 1 hour is 20 or less, and the average crystal grain size d ave is 400 μm or less.
8 . The pure copper plate or sheet according to claim 1 ,
wherein a Vickers hardness of the copper plate or sheet is 150 Hv or less.Join the waitlist — get patent alerts
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