Waveguide component for high frequency testing

Abstract

A waveguide interface is disclosed. The disclosed waveguide interface comprises: an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region.

What is claimed is: 
     
         1 . A waveguide interface, comprising:
 an inner boundary region extending peripherally around a cavity;   a recessed region extending peripherally around the inner boundary region; and   a plurality of protrusions extending from the recessed region.   
     
     
         2 . The waveguide interface of  claim 1 , wherein the plurality of protrusions is arranged concentrically within the recessed region. 
     
     
         3 . The waveguide interface of  claim 1 , further comprising an outer boundary region extending peripherally around the recessed region. 
     
     
         4 . The waveguide interface of  claim 1 , further comprising at least one hole configured to receive a fastener. 
     
     
         5 . The waveguide interface of  claim 1 , further comprising at least one hole configured to receive an alignment pin. 
     
     
         6 . The waveguide interface of  claim 1 , wherein the recessed region has a depth that is a is quarter of a wavelength of electromagnetic waves guided through the cavity at a frequency at which the waveguide interface is configured to operate. 
     
     
         7 . The waveguide interface of  claim 1 , wherein a protrusion of the plurality of protrusions is shaped like a rectangular column. 
     
     
         8 . The waveguide interface of  claim 1 , wherein the plurality of protrusions is arranged as a first ring of protrusions surrounding the inner boundary region and a second ring of protrusions surrounding the first ring of protrusions. 
     
     
         9 . The waveguide interface of  claim 1 , wherein at least a part of the inner boundary region has a thickness extending radially outward from the cavity to the recessed region of a quarter of a wavelength of electromagnetic waves guided through the cavity at a frequency at which the waveguide interface is configured to operate. 
     
     
         10 . The waveguide interface of  claim 1 , wherein the cavity, the inner boundary region, and the plurality of protrusions are substantially level with one another. 
     
     
         11 . A system, comprising:
 a waveguide component that includes a first end, wherein the first end includes an interface configured to electrically couple to a device undergoing electronic testing; and   a set of one or more tracks configured to couple to an electronic testing equipment that is configured to couple to a second end of the waveguide component.   
     
     
         12 . The system of  claim 11 , wherein the interface at the first end of the waveguide component includes an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region. 
     
     
         13 . The system of  claim 12 , wherein the device undergoing testing is positioned a distance from the interface at the first end of the waveguide component that is less than a quarter of a wavelength of electromagnetic waves travelling in air at a frequency at which the waveguide interface is configured to operate but is not in physical contact with the waveguide interface. 
     
     
         14 . The system of  claim 11 , wherein the electronic testing equipment is an extension is component of a network analyzer. 
     
     
         15 . The system of  claim 11 , wherein the set of one or more tracks is configured to guide the electronic testing equipment along a first linear direction. 
     
     
         16 . The system of  claim 15 , further comprising an additional set of one or more tracks configured to guide the electronic testing equipment along a second linear direction orthogonal to the first linear direction. 
     
     
         17 . The system of  claim 15 , wherein movement of the electronic testing equipment along the first linear direction is actualized by a motor. 
     
     
         18 . The system of  claim 15 , wherein movement of the electronic testing equipment along the first linear direction is at least in part controlled by a computer. 
     
     
         19 . The system of  claim 15 , further comprising a turntable coupled to the electronic testing equipment that is configured to allow the electronic testing equipment to rotate about an axis orthogonal to the first linear direction. 
     
     
         20 . A method, comprising:
 aligning a device under test with a waveguide interface of a waveguide component, wherein the waveguide interface includes an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region; and   causing electromagnetic waves to be transmitted from an electronic testing equipment through the waveguide component to the device under test.