System and method of measuring grain orientations

Abstract

A system and a method of measuring grain orientations of a metal component. The method includes defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations. The method further includes defining a nominal grain orientation at each measurement location. The method further includes loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component. The method further includes locating the metal component in the computer-controllable fixture. The method further includes taking the series of measurements at the series of measurement locations. The method further includes analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

We claim: 
     
         1 . A method of measuring grain orientations of a metal component, the method comprising:
 defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations;   defining a nominal grain orientation at each measurement location;   loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component;   locating the metal component in the computer-controllable fixture;   taking the series of measurements at the series of measurement locations; and   analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.   
     
     
         2 . The method of  claim 1 , wherein the nominal grain orientation is defined based on a viewing attitude at each measurement location. 
     
     
         3 . The method of  claim 1 , wherein taking the series of measurements further comprises recording the series of measurements. 
     
     
         4 . The method of  claim 1 , wherein analysing the measurement at each measurement location further comprises:
 determining a difference between the measurement at each measurement location and the nominal grain orientation at the corresponding measurement location; and   comparing the difference with a threshold difference.   
     
     
         5 . The method of  claim 4 , wherein the threshold difference is an angle of 10 degrees. 
     
     
         6 . The method of  claim 1 , further comprising irradiating the metal component with an X-ray beam using an X-ray source at each measurement location. 
     
     
         7 . The method of  claim 6 , further comprising detecting diffracted X-rays from each measurement location on the metal component using an X-ray detector. 
     
     
         8 . The method of  claim 7 , further comprising moving the metal component via the computer-controllable fixture to each measurement location. 
     
     
         9 . The method of  claim 8 , wherein moving the metal component further comprises translating the metal component along one or more axes such that a distance between the X-ray source, each measurement location on the metal component and the X-ray detector is substantially constant. 
     
     
         10 . The method of  claim 9 , wherein moving the metal component further comprises rotating the metal component about one or more planes such that a normal to a surface of the metal component at each measurement location subtends a substantially constant angle Ai at the X-ray source. 
     
     
         11 . The method of  claim 1 , wherein analysing the measurement at each measurement location further includes fitting a Laue pattern mask to the measurement. 
     
     
         12 . The method of  claim 1 , wherein the computer-controllable fixture is a six-axis computer-controllable fixture. 
     
     
         13 . A system for measuring grain orientations of a metal component, the system comprising:
 a computer-controllable fixture for positioning the metal component; and   a controller configured to:
 receive a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations; 
 define a nominal grain orientation at each measurement location; 
 load the measurement locations into a computer-controllable fixture suitable for positioning the metal component; 
 locate the metal component (in the computer-controllable fixture; 
 take a series of measurements at the series of measurement locations; and 
 analyse the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location. 
   
     
     
         14 . The system of  claim 13 , further comprising:
 an X-ray source for irradiating the metal component with an X-ray beam at each measurement location; and   an X-ray detector for detecting diffracted X-rays from each measurement location on the metal component.   
     
     
         15 . The system of  claim 13 , wherein the computer-controllable fixture is a six-axis computer-controllable fixture. 
     
     
         16 . The system of  claim 14 , wherein the computer-controllable fixture is a six-axis computer-controllable fixture.