Image sensor with large dynamic range

Abstract

Disclosed herein is an image sensor comprising an array of APDs, an electronic system configured to individually control reverse biases on the APDs based on intensities of light incident on the APDs.

What is claimed is: 
     
         1 . An image sensor comprising:
 an array of APDs;   an electronic system configured to individually control reverse biases on the APDs based on intensities of light incident on the APDs.   
     
     
         2 . The image sensor of  claim 1 , wherein the electronic system is configured to set the reverse biases differently to different APDs in the array. 
     
     
         3 . The image sensor of  claim 1 , wherein the APDs are configured such that, at a given time, a first one of the APDs operates in a linear mode and a second one of the APDs operates in a Geiger mode. 
     
     
         4 . The image sensor of  claim 1 , wherein the electronic system is configured to determine the intensities of light incident on the APDs operating in a linear mode and the intensities of light incident on the APDs operating in a Geiger mode. 
     
     
         5 . The image sensor of  claim 1 , wherein the electronic system is configured to cause APDs in the array that are exposed to intensities of light above a saturation intensity of these APDs to operate in a linear mode. 
     
     
         6 . The image sensor of  claim 5 , wherein the electronic system is configured to cause APDs in the array that are exposed to intensities of light above the saturation intensity of these APDs to operate in the linear mode by reducing the reverse biases on these APDs to a value below a breakdown voltage of these APDs from a value above the breakdown voltage. 
     
     
         7 . The image sensor of  claim 1 , wherein the electronic system is configured to cause APDs in the array that are exposed to intensities of light below a saturation intensity of these APDs to operate in a Geiger mode. 
     
     
         8 . The image sensor of  claim 7 , wherein the electronic system is configured to cause APDs in the array that are exposed to intensities of light below the saturation intensity of these APDs to operate in the Geiger mode by increasing the reverse biases on these APDs to a value above a breakdown voltage of these APDs from a value below the breakdown voltage. 
     
     
         9 . The image sensor of  claim 1 , wherein the electronic system is configured to individually switch the APDs in the array between operating in a linear mode and operating in a Geiger mode based on intensities of light incident on the APDs. 
     
     
         10 . The image sensor of  claim 1 , wherein the image sensor is configured to output a representation of intensities of the light incident on the APDs, without passing operating modes of the APDs to downstream circuits. 
     
     
         11 . The image sensor of  claim 1 , wherein the APDs are in or on a first substrate and the electronic system is in or on a second substrate; wherein the first substrate and the second substrate are bonded together. 
     
     
         12 . The image sensor of  claim 11 , further comprising transmission lines in the first substrate or in the second substrate. 
     
     
         13 . The image sensor of  claim 1 , further comprising vias that are configured to electrically connect the APDs and the electronic system. 
     
     
         14 . A telescopic sight comprising the image sensor of  claim 1 . 
     
     
         15 . A night vision goggle comprising the image sensor of  claim 1 . 
     
     
         16 . A telescope comprising the image sensor of  claim 1 . 
     
     
         17 . A spectrometer comprising the image sensor of  claim 1 . 
     
     
         18 . A vehicle comprising the image sensor of  claim 1 , wherein the vehicle is a land vehicle, a space vehicle, an aerial vehicle, or a water surface vehicle.