Methods for Determining Misalignment of X-ray Detectors

Abstract

Disclosed herein is a method comprising: obtaining a third image from a first X-ray detector when the first X-ray detector and a second X-ray detector are misaligned; determining, based on a shift between a first image and the third image, a misalignment between the first X-ray detector and the second X-ray detector when the first and second detectors are misaligned; wherein the first image is an image the first X-ray detector should capture if the first and the second detectors are aligned.

What is claimed is: 
     
         1 . A method comprising:
 obtaining an image of one cross pattern among a plurality of cross patterns of a scene, by one chip of a plurality of chips of an X-ray detector;   determining a relative position of the one chip relative to the one cross pattern from the image;   wherein relative positions of the plurality of cross patterns are known with respect to one another.   
     
     
         2 . The method of  claim 1 , wherein the one chip is shifted or rotated relative to the one cross pattern. 
     
     
         3 . The method of  claim 1 , wherein the one cross pattern comprises two lines with finite widths. 
     
     
         4 . The method of  claim 3 , wherein determining the relative position comprises determining two positions of the one chip, wherein the two positions are on one of the two lines. 
     
     
         5 . The method of  claim 3 , wherein determining the relative position comprises fitting intensities detected by at least some pixels of the one chip as a function of location of the one chip.