Systems and methods for automated testing of power supply units
Abstract
An automated testing system for power supply units includes a frame, automated test equipment supported by the frame, a test jig supported by the frame and coupled with the automated test equipment, and a robotic arm coupled to the frame. The robotic arm is configured to move a power supply unit onto the test jig to interface with the automated test equipment. The automated test equipment is configured to perform one or more tests on the power supply unit when the power supply unit is interfaced with the automated test equipment, and the robotic arm is configured to move the power supply unit off of the test jig after the one or more tests are completed. Methods of performing automated testing for power supply units are also disclosed.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An automated testing system comprising:
automated test equipment configured to:
identify a model of a power supply unit;
select a power supply interface corresponding with the power supply unit; and
perform one or more tests on the power supply unit in response to the power supply unit being interfaced with the automated test equipment via the selected power supply interface; and
a robotic arm configured to:
move the power supply unit from a first location to a second location interfacing the power supply unit with the selected power supply interface; and
move the power supply unit from the second location to a third location in response to a completion of the one or more tests;
wherein the first location is different from the second location.
2 . The automated testing system of claim 1 further comprising an elevator configured to:
support the selected power supply interface; and
align the selected power supply interface between the automated test equipment and the power supply unit.
3 . The automated testing system of claim 2 further comprising a plurality of power supply interfaces supported by the elevator, the plurality of power supply interfaces comprising the selected power supply interface.
4 . The automated testing system of claim 1 , wherein the second location comprises a first test jig coupled with the automated test equipment.
5 . The automated testing system of claim 4 further comprising a second test jig coupled with the automated test equipment;
wherein the power supply unit comprises a first power supply unit; and
wherein the robotic arm is further configured to move a second power supply unit to the second jig while the first power supply unit is interfaced with the automated test equipment.
6 . The automated testing system of claim 5 , wherein the automated test equipment configured to perform the one or more tests on the second power supply unit after completing the one or more tests on the first power supply unit.
7 . The automated testing system of claim 5 , wherein the automated test equipment configured to perform the one or more tests on the first and second power supply units at the same time via multiplexing.
8 . The automated testing system of claim 1 , wherein the first location is different from the third location.
9 . The automated testing system of claim 1 , wherein the first location comprises a conveyor belt.
10 . The automated testing system of claim 1 , wherein the third location comprises a pass location.
11 . The automated testing system of claim 1 , wherein the robotic arm is further configured to move the power supply unit from the second location to a fourth location in response to the power supply unit failing the one or more tests, wherein the fourth location comprises a reject location.
12 . A method of performing automated testing for power supply units, the method comprising:
identifying, via automated test equipment, a model of a power supply unit; selecting, via the automated test equipment, a power supply interface corresponding with the power supply unit; moving, via a robotic arm, the power supply unit from a first location to a second location; interfacing, via the selected power supply interface, the power supply unit with the automated test equipment; performing, via the automated test equipment, one or more tests on the power supply unit in response to the power supply unit being interfaced with the automated test equipment; and moving, via the robotic arm, the power supply unit from the second location to a third location in response to a completion of the one or more tests; wherein the first location is different from the second location.
13 . The method of claim 12 , wherein identifying the model of the power supply unit comprises identifying the model of the power supply unit in response to an RFID tag associated with the power supply unit.
14 . The method of claim 13 further comprising:
obtaining, by the automated test equipment, a test script corresponding to the identified model of the power supply unit; and
performing the one or more tests based on the test script.
15 . The method of claim 13 , wherein selecting the power supply interface comprises aligning, via an elevator, the selected power supply interface with the automated test equipment.
16 . A method of performing automated testing for power supply units, the method comprising:
identifying, via automated test equipment:
a model of a first power supply unit; and
a model of a second power supply unit;
selecting, via the automated test equipment:
a first power supply interface corresponding with the first power supply unit; and
a second power supply interface corresponding with the second power supply unit;
moving, via a robotic arm:
the first power supply unit from a first location to a second location; and
the second power supply unit from a third location to a fourth location;
interfacing, via the selected power supply interface, the first and second power supply units with the automated test equipment; performing, via the automated test equipment, one or more tests on the first and second power supply units in response to the first and second power supply units being interfaced with the automated test equipment; and moving, via the robotic arm:
the first power supply unit from the second location to a fifth location in response to a completion of the one or more tests thereon; and
the second power supply from the fourth location to a sixth location in response to a completion of the one or more tests thereon;
wherein the first location is different from the second location; and wherein the third location is different from the fourth location.
17 . The method of claim 16 , wherein the first and third locations are the same locations.
18 . The method of claim 16 , wherein performing the one or more tests on the first and second power supply units comprises performing the one or more tests on the first power supply unit prior to performing the one or more tests on the second power supply unit.
19 . The method of claim 18 , wherein moving the second power supply unit comprises moving the second power supply unit while the first power supply unit is interfaced with the automated test equipment.
20 . The method of claim 16 further comprising:
obtaining a first test script based on the model of the first power supply unit;
obtaining a second test script based on the model of the second power supply unit; and
wherein performing the one or more tests on the first and second power supply units comprises performing the one or more tests based on the first and second test scripts.Join the waitlist — get patent alerts
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