US2021343337A1PendingUtilityA1

Nonvolatile semiconductor memory device

Assignee: TOSHIBA MEMORY CORPPriority: Aug 13, 2008Filed: Jul 13, 2021Published: Nov 4, 2021
Est. expiryAug 13, 2028(~2 yrs left)· nominal 20-yr term from priority
G11C 13/0004G11C 2213/72G11C 13/0023G11C 13/0069G11C 2213/31G11C 13/0007G11C 13/004G11C 13/0011G11C 13/003
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Claims

Abstract

A nonvolatile semiconductor memory device comprises a cell array including a plurality of first lines, a plurality of second lines intersecting the plurality of first lines, and a plurality of memory cells arranged in matrix and connected at intersections of the first and second lines between both lines, each memory cell containing a serial circuit of an electrically erasable programmable variable resistive element of which resistance is nonvolatilely stored as data and a non-ohmic element; and a plurality of access circuits operative to simultaneously access the memory cells physically separated from each other in the cell array.

Claims

exact text as granted — not AI-modified
1 . A nonvolatile semiconductor memory device, comprising:
 a cell array including a plurality first lines, a plurality of second lines intersecting said plurality of first lines, and a plurality of memory cells arranged in matrix and connected at intersections of said first and second lines between both lines, each memory cell containing a serial circuit of an electrically erasable programmable variable resistive element of which resistance is nonvolatilely stored as data and a non-ohmic element;   and   an access circuit operative to simultaneously access plural memory cells physically separated from each other in said cell array.

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