Method for determining a detection sensitivity of a rotation rate sensor
Abstract
A method for determining a detection sensitivity of a rotation rate sensor, the rotation rate sensor including an oscillatory system. A first quadrature signal of the oscillatory system is determined in a first step. A controlled change of a transfer function of the oscillatory system takes place in a second step. A second quadrature signal of the oscillatory system is determined in a third step. The detection sensitivity is determined in a fourth step on the basis of the first and second quadrature signal. A method is also described for determining a detection sensitivity of a rotation rate sensor, the rotation rate sensor including one first oscillatory system and one second oscillatory system.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for determining a detection sensitivity of a rotation rate sensor, the rotation rate sensor including an oscillatory system, the method comprising:
in a first step, determining a first quadrature signal of the oscillatory system; in a second step, performing a controlled change of a transfer function of the oscillatory system; in a third step, determining a second quadrature signal of the oscillatory system; and in a fourth step, determining the detection sensitivity based on the first quadrature signal and the second quadrature signal.
2 . The method as recited in claim 1 , wherein, in the second step, a controlled change of an inherent frequency of the oscillatory system takes place and/or a controlled change of a quality factor of the oscillatory system takes place.
3 . The method as recited in claim 2 , wherein the change of the inherent frequency takes place via a controlled change of a spring constant of the oscillatory system.
4 . The method as recited in claim 1 , wherein further controlled changes of the transfer function take place and further quadrature signals of the rotation rate sensor are determined in a fifth step following the third step and preceding the fourth step, the detection sensitivity being determined in the fourth step based on the first, second and further quadrature signals.
5 . The method as recited in claim 1 , wherein a compensation variable for a detection signal is determined in a fifth step following the fourth step based on the detection sensitivity determined in the fourth step.
6 . A method for determining a detection sensitivity of a rotation rate sensor, the rotation rate sensor including one first oscillatory system and one second oscillatory system, a transfer function of the first oscillatory system differing from a transfer function of the second oscillatory system, the method comprising:
in a first step, determining a first quadrature signal of the first oscillatory system; in a second step, determining a second quadrature signal of the second oscillatory system; and in a fourth step, determining the detection sensitivity based on the first quadrature signal and the second quadrature signal.
7 . The method as recited in claim 6 , wherein a quality factor of the first oscillatory system is identical to a quality factor of the second oscillatory system, and/or a mass of the first oscillatory system differs from a mass of the second oscillatory system and/or a spring constant of the first oscillatory system differs from a spring constant of the second oscillatory system.
8 . The method as recited in claim 6 , wherein a compensation variable for a detection signal is determined in a fifth step following the fourth step based on the detection sensitivity determined in the fourth step.
9 . The method as recited in claim 5 , wherein: (i) the rotation rate sensor includes a register that includes a plurality of value pairs of the detection sensitivity and of the compensation variable, the compensation variable being determined via selection of a value from the register, or (ii) the compensation variable is determined via an analytical, linear correlation between the detection sensitivity and the compensation variable.
10 . The method as recited in claim 1 , wherein a first detection signal is determined in the first step and a second detection signal is determined in the second step, a temperature effect on a mechanical phase of the oscillatory system being ascertained in a sixth step following the fourth step based on the first detection signal and the second detection signal.Join the waitlist — get patent alerts
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