Method and device for searching new material

Abstract

A method for searching a new material includes: performing a learning on a material model, which is modeled based on a known material; determining a candidate material by inputting a targeted physical property to a result of the learning; and determining the new material from the candidate material.

What is claimed is: 
     
         1 . A method for searching a material having a targeted physical property using a high-throughput screening, the method comprising:
 performing a learning on a material model which is modeled based on a known material;   determining a candidate material by inputting the targeted physical property to a result of the learning; and   determining the material having the targeted physical property from the candidate material,   wherein the performing the learning on the material model comprises:   modeling the material model based upon first structure information, which is information on a structure of the known material, first physical property information, which is information on a physical property of the known material, information on a potential factor, and a learning parameter,   wherein the learning parameter comprises at least one of a default value parameter on the structure of the known material, a default value parameter on the physical property of the known material, a default value parameter of the potential factor, a relationship parameter between the structure of the known material and the potential factor, and a relationship parameter between the physical property of the known material and the potential factor.   
     
     
         2 . The method of  claim 1 , wherein the performing the learning on the material model further comprises:
 updating the learning parameter; and   determining whether to finish the learning based on an update result of the learning parameter.   
     
     
         3 . The method of  claim 2 , wherein
 the first structure information comprises information on a partial structure in a molecular structure of the known material.   
     
     
         4 . The method of  claim 2 , wherein
 the first structure information comprises information on atoms in the molecular structure of the known material and information on a combination of the atoms.   
     
     
         5 . The method of  claim 2 , wherein
 the first structure information comprises two-dimensional image information on the molecular structure of the known material.   
     
     
         6 . The method of  claim 2 , wherein
 the performing the learning on the material model further includes   resetting the learning parameter with a random value before the modeling.   
     
     
         7 . The method of  claim 2 , wherein
 the modeling the material model comprises:   determining a probability function of the material model from an energy function based on the first structure information, the first physical property information, and the learning parameter; and   generating second structure information, which is information on a structure of the material having the targeted physical property, and second physical property information, which is information on a physical property of the material having the targeted physical property, based on the probability function of the material model.   
     
     
         8 . The method of  claim 7 , wherein
 the updating the learning parameter comprises:   updating the learning parameter based on a free energy function of the material model deduced based on the probability function and the energy function.   
     
     
         9 . The method of  claim 8 , wherein
 the updating the learning parameter based on the probability function and the free energy function comprises:   updating the learning parameter by using a difference between the learning parameter and an objective function expressed as the free energy function.   
     
     
         10 . The method of  claim 9 , wherein
 the objective function represents a function deduced from a differential expression of the probability function.   
     
     
         11 . The method of  claim 1 , wherein the determining the material having the targeted physical property among the candidate material comprises:
 verifying at least one of physical validity, and chemical stability the candidate material; and   determining the verified candidate material from the candidate material to be the advanced material having the targeted physical property.   
     
     
         12 . A device for searching a material as a device for searching an advance material having a targeted physical property using a high-throughput screening, the device comprising a processor, wherein the processor includes:
 a learning performer which performs a learning on a material model that is modeled based on a known material; and   a material determiner which determines a candidate material by inputting a targeted physical property to a result of the learning, and determines a material having the targeted physical property from the candidate material,   wherein the learning performer comprises:   a material modeler which models the material model based on first structure information, which is information on a structure of the known material, first physical property information, which is information on a physical property of the known material, information on a potential factor, and a learning parameter,   wherein the learning parameter comprises at least one of a default value parameter on the structure of the known material, a default value parameter on a physical property of the known material, a default value parameter of the potential factor, a relationship parameter between the structure of the known material and the potential factor, and a relationship parameter between the physical property of the known material and the potential factor.   
     
     
         13 . The device of  claim 12 , wherein the learning performer further comprises:
 a parameter updater which updates the learning parameter; and   a learning performance finisher which determines whether to finish the learning based on an update result of the learning parameter.   
     
     
         14 . The device of  claim 13 , wherein
 the first structure information comprises information on a partial structure included in a molecular structure of the known material.   
     
     
         15 . The device of  claim 13 , wherein
 the first structure information comprises information on atoms in the molecular structure of the known material and information on a combination of the atoms.   
     
     
         16 . The device of  claim 13 , wherein
 the first structure information comprises two-dimensional image information on the molecular structure of the known material.   
     
     
         17 . The device of  claim 13 , wherein
 the material modeler resets the learning parameter with a random value before the modeling.   
     
     
         18 . The device of  claim 13 , wherein
 the material modeler determines a probability function of the material model from an energy function based on the first structure information, the first physical property information, and the learning parameter, and generates second structure information, which is information on a structure of the material having the targeted physical property, and second physical property information, which is information on a physical property of the material having the targeted physical property, based on the probability function of the material model.   
     
     
         19 . The device of  claim 18 , wherein
 the parameter updater updates the learning parameter based on a free energy function of the material model deduced based on the probability function and the energy function.   
     
     
         20 . The device of  claim 19 , wherein
 the parameter updater updates the learning parameter by using a difference between the learning parameter and an objective function expressed as the free energy function.   
     
     
         21 . The device of  claim 20 , wherein
 the objective function represents a function deduced from a differential expression of the probability function.   
     
     
         22 . The device of  claim 12 , wherein
 the material determiner verifies at least one of physical validity, and chemical stability of the candidate material, and determines the verified candidate material from the candidate material to be the material having the targeted physical property.