US2021136615A1PendingUtilityA1
Communication method and device
Est. expiryMar 24, 2037(~10.7 yrs left)· nominal 20-yr term from priority
H04W 72/542H04W 72/046H04W 36/0085H04L 5/0057H04B 7/0695H04B 7/06952H04W 36/0083H04W 36/0058H04W 16/28H04W 24/10
66
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Claims
Abstract
Embodiments of this application relate to the field of communications technologies and disclose a communication method and a device. The method includes: determining an offset based on a first quantity, wherein the first quantity is a quantity of beams that are used to determine signal quality of a first cell; and determining the signal quality of the first cell based on the offset.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A communication method comprising:
determining, by a terminal, first signal quality of a first cell based on a first quantity of beams in the first cell; determining, by the terminal, an offset based on the first quantity; and determining, by the terminal, second signal quality of the first cell based on the offset and the first signal quality.
2 . The method according to claim 1 , wherein determining the offset based on the first quantity comprises:
determining a coefficient of basic measurement offset delta based on the first quantity; and multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.
3 . The method according to claim 2 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.
4 . The method according to claim 1 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.
5 . The method according to claim 4 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold.
6 . The method according to claim 5 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0.
7 . The method according to claim 6 , wherein X is equal to 1.
8 . The method according to claim 4 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam.
9 . The method according to claim 1 , further comprising: sending the second signal quality of the first cell.
10 . An apparatus, comprising:
a non-transitory memory storage comprising instructions; and one or more processors in communication with the memory storage, wherein the one or more processors execute the instructions to cause the apparatus to: determine first signal quality of a first cell based on a first quantity of beams in the first cell; determine an offset based on the first quantity; and determine second signal quality of the first cell based on the offset and the first signal quality.
11 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:
determine a coefficient of basic measurement offset delta based on the first quantity; and multiply the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.
12 . The apparatus according to claim 11 , wherein the one or more processors further execute the instructions to cause the apparatus to:
adjust, by using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.
13 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:
adjust, by using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.
14 . The apparatus according to claim 13 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold.
15 . The apparatus according to claim 14 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0.
16 . The apparatus according to claim 15 , wherein X is equal to 1.
17 . The apparatus according to claim 13 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam.
18 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to: send the second signal quality of the first cell.
19 . A non-transitory computer-readable storage medium storing a program to be executed by a processor, the program including instructions for:
determining first signal quality of a first cell based on a first quantity of beams in the first cell; determining an offset based on the first quantity; and determining second signal quality of the first cell based on the offset and the first signal quality.
20 . The storage medium according to claim 19 , wherein the program further includes instructions for:
determining a coefficient of basic measurement offset delta based on the first quantity; and multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.Join the waitlist — get patent alerts
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