US2021136615A1PendingUtilityA1

Communication method and device

Assignee: HUAWEI TECH CO LTDPriority: Mar 24, 2017Filed: Jan 12, 2021Published: May 6, 2021
Est. expiryMar 24, 2037(~10.7 yrs left)· nominal 20-yr term from priority
H04W 72/542H04W 72/046H04W 36/0085H04L 5/0057H04B 7/0695H04B 7/06952H04W 36/0083H04W 36/0058H04W 16/28H04W 24/10
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Claims

Abstract

Embodiments of this application relate to the field of communications technologies and disclose a communication method and a device. The method includes: determining an offset based on a first quantity, wherein the first quantity is a quantity of beams that are used to determine signal quality of a first cell; and determining the signal quality of the first cell based on the offset.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A communication method comprising:
 determining, by a terminal, first signal quality of a first cell based on a first quantity of beams in the first cell;   determining, by the terminal, an offset based on the first quantity; and   determining, by the terminal, second signal quality of the first cell based on the offset and the first signal quality.   
     
     
         2 . The method according to  claim 1 , wherein determining the offset based on the first quantity comprises:
 determining a coefficient of basic measurement offset delta based on the first quantity; and   multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.   
     
     
         3 . The method according to  claim 2 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell. 
     
     
         4 . The method according to  claim 1 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell. 
     
     
         5 . The method according to  claim 4 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold. 
     
     
         6 . The method according to  claim 5 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0. 
     
     
         7 . The method according to  claim 6 , wherein X is equal to 1. 
     
     
         8 . The method according to  claim 4 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam. 
     
     
         9 . The method according to  claim 1 , further comprising: sending the second signal quality of the first cell. 
     
     
         10 . An apparatus, comprising:
 a non-transitory memory storage comprising instructions; and   one or more processors in communication with the memory storage, wherein the one or more processors execute the instructions to cause the apparatus to:   determine first signal quality of a first cell based on a first quantity of beams in the first cell;   determine an offset based on the first quantity; and   determine second signal quality of the first cell based on the offset and the first signal quality.   
     
     
         11 . The apparatus according to  claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:
 determine a coefficient of basic measurement offset delta based on the first quantity; and   multiply the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.   
     
     
         12 . The apparatus according to  claim 11 , wherein the one or more processors further execute the instructions to cause the apparatus to:
 adjust, by using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.   
     
     
         13 . The apparatus according to  claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:
 adjust, by using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.   
     
     
         14 . The apparatus according to  claim 13 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold. 
     
     
         15 . The apparatus according to  claim 14 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0. 
     
     
         16 . The apparatus according to  claim 15 , wherein X is equal to 1. 
     
     
         17 . The apparatus according to  claim 13 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam. 
     
     
         18 . The apparatus according to  claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to: send the second signal quality of the first cell. 
     
     
         19 . A non-transitory computer-readable storage medium storing a program to be executed by a processor, the program including instructions for:
 determining first signal quality of a first cell based on a first quantity of beams in the first cell;   determining an offset based on the first quantity; and   determining second signal quality of the first cell based on the offset and the first signal quality.   
     
     
         20 . The storage medium according to  claim 19 , wherein the program further includes instructions for:
 determining a coefficient of basic measurement offset delta based on the first quantity; and   multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.

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