US2021135048A1PendingUtilityA1
Micro light-emitting diode (led) elements and display
Est. expiryAug 18, 2037(~11 yrs left)· nominal 20-yr term from priority
H10W 90/00H10W 72/0198H10H 20/854H10H 29/142H10H 20/8314H10H 20/8312H10H 20/831H10H 20/825H10H 20/821H10H 20/818H10H 20/812H10H 20/811H10H 20/81H01L 33/32H01L 33/38H01L 33/382H01L 33/06H01L 33/385H01L 33/02H01L 33/18H01L 25/0753H01L 33/24H01L 27/156H01L 33/04
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Claims
Abstract
Micro light-emitting diode (LED) displays and assembly apparatuses are described. In an example, a pixel element for a micro-light emitting diode (LED) display panel includes a first color nanowire LED, a second color nanowire LED, the second color different than the first color, and a pair of third color nanowire LEDs, the third color different than the first and second colors. A continuous insulating material layer ius laterally surrounding the first color nanowire LED, the second color nanowire LED, and the pair of third color nanowire LEDs.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A red-emitting diode structure, comprising:
an InGaN nanowire core above a substrate; and an InGaN active layer on the InGaN nanowire core, wherein the InGaN active layer has a greater concentration of In than the InGaN nanowire.
2 . The red-emitting diode structure of claim 1 , wherein the InGaN nanowire core is an In 0.2 Ga 0.8 N material nanowire core.
3 . The red-emitting diode structure of claim 2 , wherein the InGaN active layer is an In 0.4 Ga 0.6 N material layer.
4 . The red-emitting diode structure of claim 1 , further comprising:
a cladding layer on the InGaN active layer, the cladding layer comprising p-type GaN or p-type ZnO.
5 . The red-emitting diode structure of claim 1 , wherein the InGaN active layer emits a wavelength in the range of 610-630 nanometers.
6 . The red-emitting diode structure of claim 1 , wherein the substrate is a silicon substrate or a sapphire substrate.
7 . A light-emitting diode, comprising:
a red-emitting diode structure having sidewalls and a tapered portion the red-emitting diode structure, comprising:
an InGaN nanowire core above a substrate; and
an InGaN active layer on the InGaN nanowire core, wherein the InGaN active layer has a greater concentration of In than the InGaN nanowire core;
a contact metal over and along the sidewalls and the tapered portion of the red-emitting diode structure, the contact metal having a non-uniform thickness over the red-emitting diode structure; and an insulating material layer laterally surrounding contact metal, the insulating material layer having a surface co-planar with a surface of the contact metal.
8 . The light-emitting diode of claim 7 , wherein the InGaN nanowire core is an In 0.2 Ga 0.8 N material nanowire core.
9 . The light-emitting diode of claim 8 , wherein the InGaN active layer is an In 0.4 Ga 0.6 N material layer.
10 . The light-emitting diode of claim 7 , wherein the InGaN active layer emits a wavelength in the range of 610-630 nanometers.
11 . A method of fabricating a red-emitting diode structure, the method comprising:
forming an InGaN nanowire core above a substrate; and forming an InGaN active layer on the InGaN nanowire core, wherein the InGaN active layer has a greater concentration of In than the InGaN nanowire.
12 . The method of claim 11 , wherein the InGaN nanowire core is an In 0.2 Ga 0.8 N material nanowire core.
13 . The method of claim 12 , wherein the InGaN active layer is an In 0.4 Ga 0.6 N material layer.
14 . The method of claim 11 , further comprising:
forming a cladding layer on the InGaN active layer, the cladding layer comprising p-type GaN or p-type ZnO.
15 . The method of claim 11 , wherein the InGaN active layer emits a wavelength in the range of 610-630 nanometers.
16 . The method of claim 11 , wherein the substrate is a silicon substrate or a sapphire substrate.
17 . An electronic device, comprising:
a processor; and a display coupled to the processor, the display comprising:
a backplane; and
a red-emitting diode structure coupled to the backplane, the red-emitting diode structure comprising:
an InGaN nanowire core above a substrate; and
an InGaN active layer on the InGaN nanowire core, wherein the InGaN active layer has a greater concentration of In than the InGaN nanowire core.
18 . The electronic device of claim 17 , further comprising:
a memory coupled to the display.
19 . The electronic device of claim 17 , further comprising:
a battery coupled to the display.
20 . The electronic device of claim 17 , further comprising:
a network interface coupled to the display.
21 . The electronic device of claim 17 , wherein the microelectronic device is a mobile device selected from the group consisting of a smartphone, a tablet, a notebook, and a smartwatch.
22 . The electronic device of claim 17 , wherein the microelectronic device is a device selected from the group consisting of a computing device, a television, and a vehicle computer display.Join the waitlist — get patent alerts
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