US2021126559A1PendingUtilityA1
Attracting method, mounting table, and plasma processing apparatus
Est. expiryOct 28, 2039(~13.2 yrs left)· nominal 20-yr term from priority
Inventors:Shoichiro Matsuyama
H10P 72/72H01J 37/32715H02N 13/00H01J 37/32091B23Q 3/15H01J 37/32642H01J 37/3244H01J 2237/2007H01J 2237/334H10P 72/7624H10P 72/0434H10P 72/0421H10P 72/722
60
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Claims
Abstract
A method of attracting an object to a mounting table is provided. The object is a substrate, an edge ring, or a combination of the substrate and the edge ring. The mounting table is provided with an electrostatic chuck including electrodes. After the object is placed on the electrostatic chuck, n-phase alternating current (AC) voltages (n≥2) are applied to the electrodes. Each phase voltage of the n-phase AC voltages has a phase different from each other, and the phase voltage of the n-phase AC voltages is applied based on a self-bias voltage of the object.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of attracting an object to a mounting table provided with an electrostatic chuck including electrodes, the method comprising:
placing the object on the electrostatic chuck; and applying n-phase alternating current (AC) voltages (n≥2) to the electrodes, each phase voltage of the n-phase AC voltages having a phase different from each other; wherein
the object is a substrate, an edge ring, or a combination of the substrate and the edge ring, and
the phase voltage of the n-phase AC voltages is applied based on a self-bias voltage of the object.
2 . The method according to claim 1 , wherein the phase voltage of the n-phase AC voltages is obtained by superimposing, on an AC component, negative direct-current (DC) voltage based on the self-bias voltage of the object.
3 . The method according to claim 2 , wherein the self-bias voltage is calculated in accordance with a condition of plasma processing.
4 . The method according to claim 2 , wherein the self-bias voltage is detected by a voltage detector configured to detect voltage of the object.
5 . A mounting table comprising:
a base; an electrostatic chuck provided on the base; n number of electrodes (n≥2) provided inside the electrostatic chuck; and a power supply configured to apply n-phase alternating current (AC) voltages to the electrodes, each phase voltage of the n-phase AC voltages having a phase different from each other; wherein the phase voltage of the n-phase AC voltages is applied based on a self-bias voltage of an object that is placed on the electrostatic chuck.
6 . The mounting table according to claim 5 , wherein the phase voltage of the n-phase AC voltages is obtained by superimposing, on an AC component, negative direct-current (DC) voltage based on the self-bias voltage of the object.
7 . A plasma processing apparatus comprising the mounting table according to claim 5 .
8 . The plasma processing apparatus according to claim 7 , further comprising a gas supply part configured to supply a heat transfer gas to a space between an upper surface of the mounting table and a back surface of the object; wherein
the object is a substrate, an edge ring, or a combination of the substrate and the edge ring.Join the waitlist — get patent alerts
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