Low-voltage collector-free bandgap voltage generator device
Abstract
Example implementations include a bandgap voltage device with a first current source operatively coupled to a bandgap input node and a bandgap output node and operable to output a first proportional-to-absolute-temperature (PTAT) current, a current mirror including a first bandgap transistor and a second bandgap transistor, and operatively coupled to the bandgap output node, and a second current source operatively coupled to the current mirror and operable to output a second PTAT current. Example implementations also include a bandgap transistor device with a first P+ layer proximate to a center of a planar surface of a transistor device, a first N+ layer at least partially surrounding the first P+ layer along the planar surface, a second P+ layer at least partially surrounding the first N+ layer along the planar surface, a second N+ layer at least partially surrounding the second P+ layer along the planar surface, and a third P+ layer at least partially surrounding the second N+ layer along the planar surface.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A bandgap voltage device comprising:
a first current source operatively coupled to a bandgap input node and a bandgap output node, and operable to output a first proportional-to-absolute-temperature (PTAT) current; a current mirror including a first bandgap transistor and a second bandgap transistor, and operatively coupled to the bandgap output node; and a second current source operatively coupled to the current mirror, and operable to output a second PTAT current.
2 . The bandgap voltage device of claim 1 , further comprising:
a third bandgap transistor operatively coupled to the bandgap output node and the current mirror.
3 . The bandgap voltage device of claim 2 , wherein the third bandgap transistor operatively couples the second current source to the current mirror.
4 . The bandgap voltage device of claim 1 , further comprising:
a voltage divider operatively coupled to the first bandgap transistor and the second bandgap transistor.
5 . The bandgap voltage device of claim 1 , further comprising:
a first biasing transistor operatively coupled to the bandgap input node, the first current source, the current mirror, and the bandgap output node;
6 . The bandgap voltage device of claim 5 , further comprising:
a second biasing transistor operatively coupled to the first current source, the second current source, and the first biasing transistor.
7 . The bandgap voltage device of claim 1 , wherein the first current source and the second current source comprise at least a proportional-to-absolute-temperature (PTAT) current generator.
8 . The bandgap voltage device of claim 1 , wherein the first bandgap transistor, the second bandgap transistor, and the third bandgap transistor each comprise a bipolar junction transistor.
9 . The bandgap voltage device of claim 8 , wherein the bipolar junction transistor comprises a first P+ layer proximate to a center of a planar surface of the transistor device.
10 . The bandgap voltage device of claim 9 , wherein the bipolar junction transistor further comprises a first N+ layer at least partially surrounding the plurality of emitter layers, and a second P+ layer at least partially surrounding the first N+ layer.
11 . The bandgap voltage device of claim 10 , wherein the bipolar junction transistor further comprises a second N+ layer at least partially surrounding the second P+ layer, and a third P+ layer at least partially surrounding the second N+ layer.
12 . A bandgap transistor device, comprising:
a first P+ layer proximate to a center of a planar surface of a transistor device; and a first N+ layer at least partially surrounding the first P+ layer along the planar surface.
13 . The bandgap transistor device of claim 12 , further comprising:
a second P+ layer at least partially surrounding the first N+ layer along the planar surface.
14 . The bandgap transistor device of claim 13 , further comprising:
a second N+ layer at least partially surrounding the second P+ layer along the planar surface.
15 . The bandgap transistor device of claim 14 , further comprising:
a third P+ layer at least partially surrounding the second N+ layer along the planar surface.
16 . The bandgap transistor device of claim 13 , further comprising:
a high voltage p-well region disposed below the first P+ layer, the first N+ layer, and the second P+ layer.
17 . The bandgap transistor device of claim 13 , wherein a first bandgap transistor comprises a first instance of the bandgap transistor device and a second bandgap transistor comprises a second instance of the bandgap transistor device, and
wherein a bandgap voltage device includes a first current source operatively coupled to a bandgap input node and a bandgap output node, a current mirror including the first bandgap transistor and the second bandgap transistor and operatively coupled to the bandgap output node, and a second current source operatively coupled to the current mirror.
18 . The bandgap transistor device of claim 17 , wherein a third bandgap transistor comprises a third instance of the bandgap transistor device, and
wherein the third bandgap transistor operatively is coupled to the bandgap output node, the first current source, and the current mirror.
19 . A system comprising:
a proportional-to-absolute-temperature (PTAT) current generator; a bandgap voltage device operatively coupled to the PTAT current generator, a bandgap input node and a bandgap output node; and a current mirror including a first bandgap transistor and a second bandgap transistor, and operatively coupled to the PTAT current generator and the bandgap output node.
20 . The system of claim 1 , further comprising a thermal shutdown (TSD) controller circuit operatively coupled to the bandgap output node.Join the waitlist — get patent alerts
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