Device for microwave measurement of a dielectric discontinuity of a material

Abstract

It is disclosed a device for microwave measurement of a dielectric discontinuity of a material to be inspected. The device comprises a launcher for waveguide, a waveguide and a receiving antenna. The launcher is configured to emit in the waveguide a microwave electromagnetic field adapted to interact with the material to be inspected. The receiving antenna is configured to receive a electromagnetic field reflected by the material to be inspected. The waveguide is configured to propagate the emitted electromagnetic field towards the material to be inspected and to convey the reflected electromagnetic field towards the receiving antenna. The waveguide has an inspection seat configured for the insertion of at least one portion of the material. At least one of either the launcher or the receiving antenna is movable in a plurality of positions around the inspection seat.

1 . A device for microwave measurement of a dielectric discontinuity of a material to be inspected, said device comprising:
 a launcher for waveguide;   a waveguide; and   a receiving antenna,   wherein:
 the launcher is configured to emit in the waveguide a microwave electromagnetic field adapted to interact with the material to be inspected; 
 the receiving antenna is configured to receive an electromagnetic field reflected by the material, said reflected electromagnetic field containing information correlated with a dielectric discontinuity of said material; 
 the waveguide is configured to:
 propagate the emitted electromagnetic field towards the material; 
 convey the reflected electromagnetic field towards the receiving antenna; said waveguide having an inspection seat configured for the insertion of at least one portion of the material, 
 
   wherein at least one of either the launcher or the receiving antenna is movable in a plurality of positions around the inspection seat.   
     
     
         2 . The device according to  claim 1 , wherein the inspection seat is a hole in a wall of the waveguide. 
     
     
         3 . The device according to  claim 1 , wherein the receiving antenna is movable in rotation in a plurality of positions around the inspection seat. 
     
     
         4 . The device according  claim 1 , wherein the inspection seat is arranged in a central portion of the waveguide. 
     
     
         5 . The device according to  claim 1 , wherein the waveguide has an external seat for insertion of the launcher and an internal seat for insertion of the receiving antenna, wherein the external seat is arranged at a peripheral portion of the waveguide and wherein the internal seat is arranged between the external seat and the inspection seat. 
     
     
         6 . The device according to  claim 1 , wherein the waveguide has an external seat for insertion of the receiving antenna and an internal seat for insertion of the launcher, wherein the external seat is arranged at a peripheral portion of the waveguide and wherein the internal seat is arranged between the external seat and the inspection seat. 
     
     
         7 . The device according to  claim 6 , wherein the internal seat has a circumferential extension around the inspection seat and the launcher or the receiving antenna is slidable, inside the receiving seat, in rotation around the inspection seat. 
     
     
         8 . The device according to  claim 1 , further comprising a support element arranged below the waveguide and having a seat coaxial with said inspection seat, the launcher or the receiving antenna being constrained to said support element, the device further comprising first rotation means associated with said support element and configured to move said support element in rotation, determining a corresponding rotation of the launcher or of the receiving antenna in a plurality of positions around the inspection seat. 
     
     
         9 . The device according to  claim 1 , comprising second rotation means associated with the waveguide and configured to move said waveguide in rotation in a plurality of positions around a geometric centre of the inspection seat. 
     
     
         10 . The device according to  claim 1 , comprising second rotation means associated with the material to be inspected and configured to move said material in rotation in a plurality of positions coaxially with respect to a geometric centre of the inspection seat. 
     
     
         11 . The device according to  claim 1 , further comprising a movement member configured to change a relative distance between the waveguide and the material to be inspected, determining a greater or lesser insertion of the material to be inspected inside the inspection seat. 
     
     
         12 . The device according to  claim 1 , wherein the waveguide comprises, in at least one portion of at least one outer edge of the waveguide, a coating made of an absorbing material adapted to at least partially absorb the electromagnetic field emitted in the waveguide. 
     
     
         13 . The device according to  claim 1 , wherein the waveguide is configured to propagate the electromagnetic field of a plurality of propagation modes towards the material. 
     
     
         14 . The device according to  claim 1 , wherein the material to be inspected comprises a biological tissue, in particular a mammary tissue or a head or a limb, and wherein said dielectric discontinuity is an inhomogeneity of the dielectric constant and/or in the conductivity of said biological tissue. 
     
     
         15 . A Microwave measurement apparatus comprising:
 a device for microwave measurement of a dielectric discontinuity of a material to be inspected, said device comprising a launcher for waveguide, a waveguide and a receiving antenna, wherein:
 the launcher is configured to emit in the waveguide a microwave electromagnetic field adapted to interact with the material to be inspected; 
 the receiving antenna is configured to receive an electromagnetic field reflected by the material, said reflected electromagnetic field containing information correlated with a dielectric discontinuity of said material; 
 the waveguide is configured to:
 propagate the emitted electromagnetic field towards the material; 
 convey the reflected electromagnetic field towards the receiving antenna; said waveguide having an inspection seat configured for the insertion of at least one portion of the material, 
 
 wherein at least one of either the launcher or the receiving antenna is movable in a plurality of positions around the inspection seat; 
   a processing unit configured to:
 process a plurality of values indicating amplitude and phase of the electromagnetic field reflected by the material in a plurality of different relative positions between the material and the receiving antenna; 
 generate, as a function of said processing, an image representative of a map of dielectric homogeneity of the material and a signal representative of the presence or absence of a non-integrity of the material. 
   
     
     
         16 . The microwave measurement apparatus according to  claim 15 , wherein the inspection seat is a hole in a wall of the waveguide. 
     
     
         17 . The microwave measurement apparatus according to  claim 15 , wherein the receiving antenna is movable in rotation in a plurality of positions around the inspection seat. 
     
     
         18 . The microwave measurement apparatus according to  claim 15 , wherein the inspection seat is arranged in a central portion of the waveguide. 
     
     
         19 . A device according to  claim 2 , wherein the receiving antenna is movable in rotation in a plurality of positions around the inspection seat. 
     
     
         20 . A device according to  claim 7 , wherein the internal seat has a circumferential extension around the inspection seat and the launcher or the receiving antenna is slidable, inside the receiving seat, in rotation around the inspection seat.