US2021039224A1PendingUtilityA1
Polishing apparatus and retainer ring
Est. expiryAug 8, 2039(~13 yrs left)· nominal 20-yr term from priority
Inventors:Takahiko Kawasaki
B24B 37/32B24B 37/24B24B 37/0053
55
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Claims
Abstract
According to one embodiment, a polishing apparatus includes a polishing head having a retainer surrounding a substrate to be polished, and a polishing pad facing the polishing head. The retainer includes a first material and a second material. The first material contains at least one of aromatic polyamide, polyphenylene sulfide, polyetherimide, polyamideimide, polyetheretherketone, or polybenzimidazole. The second material contains a fluororesin.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A polishing apparatus comprising:
a polishing head having a retainer surrounding a substrate to be polished; and a polishing pad facing the polishing head, wherein the retainer includes a first material and a second material, wherein the first material contains at least one of aromatic polyamide, polyphenylene sulfide, polyetherimide, polyamideimide, polyetheretherketone (PEEK), or polybenzimidazole, and wherein the second material contains a fluororesin.
2 . The polishing apparatus according to claim 1 ,
wherein a weight percentage of the second material with respect to the first material is 1% to 10%.
3 . The polishing apparatus according to claim 1 ,
wherein the fluororesin of the second material includes at least one of polytetrafluoroethylene (PTFE), perfluoroalkoxyalkane (PFA), a perfluoroethylene propene copolymer (FEP), an ethylene tetrafluoroethylene copolymer (ETFE), polyvinylidene fluoride (PVDF), polychlorotrifluoroethylene (PCTFE), ethylene chlorotrifluoroethylene copolymer (ECTFE), tetrafluoroethylene-perfluorodioxole copolymer (TFE/PDD), or polyvinyl fluoride (PVF).
4 . The polishing apparatus according to claim 3 ,
wherein the first material contains PEEK and the fluororesin of the second material includes PTFE, and wherein the weight of PTFE with respect to the weight of PEEK is 1% to 20%.
5 . The polishing apparatus according to claim 1 ,
wherein the retainer is a retainer ring.
6 . A retainer ring for use a polishing head for holding a substrate to be polished, the retainer ring comprising:
a first material and a second material, wherein the first material contains at least one of aromatic polyamide, polyphenylene sulfide, polyetherimide, polyamideimide, polyetheretherketone (PEEK), or polybenzimidazole, and wherein the second material contains a fluororesin.
7 . The retainer ring according to claim 6 ,
wherein a weight percentage of the second material with respect to the first material is 1% to 10%.
8 . The retainer ring according to claim 6 ,
wherein the fluororesin includes at least one of polytetrafluoroethylene (PTFE), perfluoroalkoxyalkane (PFA), a perfluoroethylene propene copolymer (FEP), an ethylene tetrafluoroethylene copolymer (ETFE), polyvinylidene fluoride (PVDF), polychlorotrifluoroethylene (PCTFE), ethylene chlorotrifluoroethylene copolymer (ECTFE), tetrafluoroethylene-perfluorodioxole copolymer (TFE/PDD), or polyvinyl fluoride (PVF).
9 . The retainer ring according to claim 8 ,
wherein the first material contains PEEK and the fluororesin of the second material includes PTFE, and wherein the weight of PTFE with respect to the weight of PEEK is 1% to 20%.
10 . A polishing head comprising the retainer ring of claim 6 .
11 . A polishing head comprising the retainer ring of claim 7 .Join the waitlist — get patent alerts
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