Method for intelligent inspections, electronic device using method, and non-transitory storage medium

Abstract

A method for intelligent inspections applicable in an electronic device scans a two-dimensional code, a scanned result including a first location information associated with the two-dimensional code. Next, the method for intelligent inspections transmits the scanned result to an inspection server to trigger the inspection server to return a command for a second location information of the electronic device. The second location information of the electronic device is given according to the command for the second location information of the electronic device. The second location information of the electronic device is transmitted to the inspection server. A related method for intelligent inspections applicable in an inspection server, and an electronic device using the method are also disclosed.

What is claimed is: 
     
         1 . An electronic device comprising:
 a storage system;   at least one processor; and   the storage system storing one or more programs, which when executed by the at least one processor, causing the at least one processor to:
 scan at least one two-dimensional code to obtain a scanned result, the scanned result comprising first location information associated with the at least one two-dimensional code; 
 transmit the scanned result to an inspection server to trigger the inspection server to respond, wherein the inspection server responds by transmitting back a command for a second location information of the electronic device; 
 obtain the second location information of the electronic device according to the command for second location information of the electronic device; and 
 transmit the second location information of the electronic device to the inspection server. 
   
     
     
         2 . The electronic device as described in  claim 1 , further causing the at least one processor to:
 capture an image of an area of the two-dimensional code after scanning the at least one two-dimensional code; and   simultaneously transmit the image of the area of the two-dimensional code to the inspection server and transmit the scanned result to the inspection server.   
     
     
         3 . The electronic device as described in  claim 2 , further causing the at least one processor to:
 provide a comment interface for adding comments to the image of the area of the two-dimensional code after capturing the image of the area of the two-dimensional code to generate an image of the area of the two-dimensional code with comments to the image; and   simultaneously transmit the image of the area of the two-dimensional code with comments to the inspection server and transmit the scanned result to the inspection server.   
     
     
         4 . The electronic device as described in  claim 3 , further causing the at least one processor to:
 organize images of the areas of the two-dimensional codes or images of the areas of the two-dimensional codes with the comments to the images in a time sequence to form an inspection record; and   display the inspection record.   
     
     
         5 . The electronic device as described in  claim 1 , further causing the at least one processor to:
 simultaneously transmit a two-dimensional code image or characteristics of the two-dimensional code to the inspection server and transmit the scanned result to the inspection server, the two-dimensional code image storing at least one of a group consisting of the unique identity, the reference value, and a current time, the characteristics of the two-dimensional code comprising at least one of a group consisting of the unique identity, the reference value, and a current time.   
     
     
         6 . The electronic device as described in  claim 1 , further causing the at least one processor to:
 organize the second location information of the electronic device to form a movement track;   integrate the movement track into a built-in map to generate an inspection path; and   display the inspection path.   
     
     
         7 . A method for intelligent inspections, applicable in an electronic device with a storage system and at least one processor, comprising:
 the at least one processor scanning at least one two-dimensional code to obtain a scanned result, the scanned result comprising a first location information associated with the at least one two-dimensional code;   the at least one processor transmitting the scanned result to an inspection server to trigger the inspection server to respond, wherein the inspection server responds by transmitting back a command for a second location information of the electronic device;   the at least one processor obtaining the second location information of the electronic device according to the command for second location information of the electronic device; and   the at least one processor transmitting the second location information of the electronic device to the inspection server.   
     
     
         8 . The method for intelligent inspections as described in  claim 7 , further comprising:
 the at least one processor capturing an image of an area of the two-dimensional code after scanning the at least one two-dimensional code; and   the at least one processor simultaneously transmitting the image of the area of the two-dimensional code to the inspection server and transmitting the scanned result to the inspection server.   
     
     
         9 . The method for intelligent inspections as described in  claim 8 , further comprising:
 the at least one processor providing a comment interface for adding comments to the image of the area of the two-dimensional code after capturing the image of the area of the two-dimensional code to generate an image of the area of the two-dimensional code with comments to the image; and   the at least one processor simultaneously transmitting the image of the area of the two-dimensional code with comments to the image to the inspection server and transmitting the scanned result to the inspection server.   
     
     
         10 . The method for intelligent inspections as described in  claim 9 , further comprising:
 the at least one processor organizing the images of the areas of the scanned two-dimensional codes or images of the areas of the scanned two-dimensional codes with the comments to the images in a time sequence to form an inspection record; and   the at least one processor displaying the inspection record.   
     
     
         11 . The method for intelligent inspections as described in  claim 7 , further comprising:
 the at least one processor simultaneously transmitting a two-dimensional code image or characteristics of the two-dimensional code to the inspection server and transmitting the scanned result to the inspection server, the two-dimensional code image storing at least one of a group consisting of the unique identity, the reference value, and a current time, the characteristics of the two-dimensional code comprising at least one of a group consisting of the unique identity, the reference value, and a current time.   
     
     
         12 . The method for intelligent inspections as described in  claim 7 , further comprising:
 the at least one processor organizing the second location information of the electronic device to form a movement track;   integrating the movement track into a built-in map to generate an inspection path; and   displaying the inspection path.   
     
     
         13 . A method for intelligent inspections, applicable in an inspection server with a storage system, and at least one processor, comprising:
 the at least one processor receiving a scanned result of at least one two-dimensional code from an electronic device, the scanned result comprising a first location information associated with the at least one two-dimensional code;   the at least one processor transmitting a command for a second location information of the electronic device to the electronic device when the scanned result of at least one two-dimensional code is received from the electronic device;   the at least one processor comparing the first location information with a second location information of the electronic device received from the electronic device to determine validity of an inspection; and   the at least one processor storing the first location information, the second location information of the electronic device, and the validity of the inspection.   
     
     
         14 . The method for intelligent inspections as described in  claim 13 , further comprising:
 the at least one processor receiving the scanned result and an image of an area of the two-dimensional code from the electronic device simultaneously; and   the at least one processor associating the scanned result with the image of the area of the scanned two-dimensional code.   
     
     
         15 . The method for intelligent inspections as described in  claim 13 , further comprising:
 the at least one processor receiving the scanned result, and an image of an area of the two-dimensional code with comments to the image from the electronic device simultaneously; and   the at least one processor associating the scanned result with the image of the area of the two-dimensional code.   
     
     
         16 . The method for intelligent inspections as described in  claim 13 , further comprising:
 the at least one processor simultaneously receiving two-dimensional code image comprising a unique identity and a reference value and receiving the scanned result from the electronic device;   the at least one processor comparing the unique identity and the reference value with a stored unique identity and a stored reference value to determine the validity of the inspection.   
     
     
         17 . The method for intelligent inspections as described in  claim 16 , further comprising:
 the at least one processor comparing the unique identity with the stored unique identity to determine whether the unique identity matches with the stored unique identity;   the at least one processor comparing the reference value with the stored reference value to determine whether the reference value matches with the stored reference value if the unique identity matches with the stored unique identity, the reference value being corresponding to the unique identity of the two-dimensional code image;   the at least one processor determining that the inspection is valid if the reference value matches with the stored reference value.   
     
     
         18 . The method for intelligent inspections as described in  claim 17 , further comprising:
 the at least one processor determining that the inspection is not valid if the unique identity does not match with the stored unique identity, or the reference value does not match with the stored reference value.   
     
     
         19 . The method for intelligent inspections as described in  claim 13 , further comprising:
 the at least one processor loading the first location information, the second location information of the electronic device, and the validity of the inspection to a database communicating with the inspection server.   
     
     
         20 . The method for intelligent inspections as described in  claim 19 , further comprising:
 the at least one processor receiving an inspection path being a map with an inspection path of the electronic device from the electronic device;   the at least one processor loading the inspection path to the database, and the inspection path is viewable through at least one terminal.