US2020411503A1PendingUtilityA1

Integrated circuit and method of forming an integrated circuit

Assignee: TAIWAN SEMICONDUCTOR MFG CO LTDPriority: Apr 29, 2016Filed: Sep 16, 2020Published: Dec 31, 2020
Est. expiryApr 29, 2036(~9.7 yrs left)· nominal 20-yr term from priority
H10W 20/427H10W 20/42H10D 84/975H10D 89/10G06F 30/394G06F 30/392H01L 27/0207H01L 2027/11875H01L 23/5286H01L 23/5226
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Claims

Abstract

An integrated circuit includes a first region. The integrated circuit further includes a first conductive structure in the first region, wherein the first conductive structure extends in a first direction. The integrated circuit further includes a second region adjacent to the first region. The integrated circuit further includes a power structure configured to supply a voltage to the first region or the second region, wherein the power structure includes a second conductive structure overlapping a boundary between the first region and the second region, the first conductive structure and the second conductive structure are aligned in a second direction different than the first direction, and the first conductive structure and the second conductive structure are separated from each other in the first direction.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . An integrated circuit comprising:
 a first region;   a first conductive structure in the first region, wherein the first conductive structure extends in a first direction;   a second region adjacent to the first region; and   a power structure configured to supply a voltage to the first region or the second region, wherein the power structure comprises a second conductive structure overlapping a boundary between the first region and the second region, the first conductive structure and the second conductive structure are aligned in a second direction different than the first direction, and the first conductive structure and the second conductive structure are separated from each other in the first direction.   
     
     
         2 . The integrated circuit of  claim 1 , further comprising a third conductive structure over the second conductive structure. 
     
     
         3 . The integrated circuit of  claim 2 , wherein the third conductive structure is in the first region. 
     
     
         4 . The integrated circuit of  claim 2 , wherein the third conductive structure is in the second region. 
     
     
         5 . The integrated circuit of  claim 2 , further comprising a conductive via electrically connecting the second conductive feature and the third conductive feature. 
     
     
         6 . The integrated circuit of  claim 1 , further comprising a third conductive structure parallel to the second conductive structure. 
     
     
         7 . The integrated circuit of  claim 6 , wherein a width of the third conductive structure in the second direction is equal to a width of the second conductive structure in the second direction. 
     
     
         8 . The integrated circuit of  claim 6 , wherein a width of the third conductive structure in the second direction is different from a width of the second conductive structure in the second direction. 
     
     
         9 . The integrated circuit of  claim 6 , wherein a length of the third conductive structure in the first direction is equal to a length of the second conductive structure in the first direction. 
     
     
         10 . The integrated circuit of  claim 9 , wherein an end of the third conductive structure is aligned with an end of the second conductive structure in the first direction. 
     
     
         11 . The integrated circuit of  claim 9 , wherein an end of the third conductive structure is offset in the first direction with respect to an end of the second conductive structure. 
     
     
         12 . The integrated circuit of  claim 6 , wherein a length of the third conductive structure in the first direction is different from a length of the second conductive structure in the first direction. 
     
     
         13 . A method of forming an integrated circuit, the method comprising:
 reducing a size of a conductive feature layout pattern of a cell layout, wherein the cell layout comprises a of conductive feature layout pattern;   placing a power layout pattern at least partially within the cell layout; and   extending a dimension of the conductive feature layout pattern in a direction toward a boundary of the power layout pattern, wherein the extending comprises increasing a dimension of the conductive feature layout pattern.   
     
     
         14 . The method of  claim 13 , wherein extending the dimension of the conductive feature comprises maintaining a minimum spacing requirement between the conductive feature layout pattern and a second conductive feature in the power layout pattern. 
     
     
         15 . The method of  claim 13 , wherein placing the power layout pattern comprises placing the power layout pattern extending across a boundary between a first region of the integrated circuit and a second region of the integrated circuit. 
     
     
         16 . The method of  claim 13  wherein placing the power layout pattern comprises placing the power layout pattern separated from all via layout patterns of the integrated circuit. 
     
     
         17 . An integrated circuit comprising:
 a first region;   a first conductive structure in the first region, wherein the first conductive structure extends in a first direction;   a second region adjacent to the first region; and   a power structure configured to supply a voltage to the first region or the second region, wherein the power structure comprises:
 a plurality of second conductive structures overlapping a boundary between the first region and the second region, wherein the first conductive structure is separated from each of the plurality of second conductive structures in the first direction; and 
   a third conductive structure electrically connected to each of the plurality of second conductive structures.   
     
     
         18 . The integrated circuit of  claim 17 , wherein a width of a first conductive structure of the plurality of second conductive structures in the second direction is different from a width of a second conductive structure of the plurality of second conductive structures in the second direction. 
     
     
         19 . The integrated circuit of  claim 17 , wherein an end of a first conductive structure of the plurality of second conductive structures is offset with respect to an end of a second conductive structure of the plurality of second conductive structures in the first direction. 
     
     
         20 . The integrated circuit of  claim 17 , wherein a length of a first conductive structure of the plurality of second conductive structures in the first direction is different from a length of a second conductive structure of the plurality of second conductive structures in the first direction.

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