Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium

Abstract

A three-dimensional shape measuring apparatus includes: a single projector device that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object; an image capture device that acquire an image of the measured object on which the first or second light pattern is projected; and an image processing device that processes the image acquired by the image capture device. The image processing device includes a relative phase value calculation unit that calculates a relative phase value on each part of the measured object based on a luminance value of an image of the measured object on which the first light pattern is projected, an absolute phase value calculation unit that calculates an absolute phase value on each part of the measured object based on a luminance value and the relative phase value of an image of the measured object on which the second light pattern is projected, and a three-dimensional coordinate calculation unit that calculates three-dimensional coordinates at each part of the measured object based on the absolute phase value.

1 . A three-dimensional shape measuring apparatus comprising:
 a single projector device that projects a first light pattern whose luminance changes at a first cycle and a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object;   an image capture device that acquires an image of the measured object on which the first light pattern or the second light pattern is projected; and   an image processing device that processes the image acquired by the image capture device,   wherein the image processing device includes
 a relative phase value calculation unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels, 
 an absolute phase value calculation unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels, and 
 a three-dimensional coordinate calculation unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels. 
   
     
     
         2 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the image capture device acquires at least three images captured with different phases of the first light pattern projected on the measured object and acquires one image in which the measured object on which the second light pattern is projected is captured or two images captured with different phases of the second light pattern projected on the measured object. 
     
     
         3 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the first light pattern is a sinusoidal pattern. 
     
     
         4 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the second light pattern is a sinusoidal pattern. 
     
     
         5 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the second light pattern is a luminance slope pattern whose luminance changes linearly. 
     
     
         6 . The three-dimensional shape measuring apparatus according to  claim 4 , wherein the second light pattern is a pattern by which a whole screen of the image corresponds to one cycle. 
     
     
         7 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the projector device generates the first light pattern and the second light pattern from a light emitted from a single light source. 
     
     
         8 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the projector device is a DLP projector or a liquid crystal projector. 
     
     
         9 . The three-dimensional shape measuring apparatus according to  claim 1 , wherein the measured object is a moving object. 
     
     
         10 . The three-dimensional shape measuring apparatus according to  claim 9 , wherein the moving object is a face of a person. 
     
     
         11 . A three-dimensional shape measuring method comprising:
 projecting a first light pattern whose luminance changes at a first cycle on a measured object and acquiring an image of the measured object on which the first light pattern is projected;   projecting a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on the measured object by the same projector device as a projector device used for projection of the first light pattern and acquiring an image of the measured object on which the second light pattern is projected;   based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculating a relative phase value on each part of the measured object corresponding to each of the pixels;   based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculating an absolute phase value on each the part of the measured object corresponding to each of the pixels; and   based on the absolute phase value, calculating three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels.   
     
     
         12 . The three-dimensional shape measuring method according to  claim 11 ,
 wherein in the acquiring an image of the measured object on which the first light pattern is projected, at least three images captured with different phases of the first light pattern projected on the measured object are acquired, and   wherein in the acquiring an image of the measured object on which the second light pattern is projected, one image in which the measured object on which the second light pattern is projected is captured or two images captured with different phases of the second light pattern projected on the measured object are acquired.   
     
     
         13 . The three-dimensional shape measuring method according to  claim 11 , wherein the first light pattern is a sinusoidal pattern. 
     
     
         14 . The three-dimensional shape measuring method according to  claim 11 , wherein the second light pattern is a sinusoidal pattern. 
     
     
         15 . The three-dimensional shape measuring method according to  claim 11 , wherein the second light pattern is a luminance slope pattern whose luminance changes linearly. 
     
     
         16 . The three-dimensional shape measuring method according to  claim 14 , wherein the second light pattern is a pattern by which a whole screen of the image corresponds to one cycle. 
     
     
         17 . The three-dimensional shape measuring method according to  claim 11 , wherein the projector device generates the first light pattern and the second light pattern from a light emitted from a single light source. 
     
     
         18 . The three-dimensional shape measuring method according to  claim 11 , wherein the projector device is a DLP projector or a liquid crystal projector. 
     
     
         19 . The three-dimensional shape measuring method according to  claim 11 , wherein the measured object is a moving object. 
     
     
         20 . The three-dimensional shape measuring method according to  claim 19 , wherein the moving object is a face of a person. 
     
     
         21 . (canceled) 
     
     
         22 . (canceled) 
     
     
         23 . A non-transitory computer readable storage medium storing the program that causes a computer to function as:
 a unit that controls a single projector device to project a first light pattern whose luminance changes at a first cycle or a second light pattern whose luminance changes at a second cycle that is longer than the first cycle on a measured object;   a unit that acquires an image of the measured object on which the first light pattern is projected and an image of the measured object on which the second light pattern is projected;   a unit that, based on a luminance value at each of pixels of an image of the measured object on which the first light pattern is projected, calculates a relative phase value on each part of the measured object corresponding to each of the pixels;   a unit that, based on a luminance value and the relative phase value at each of pixels of an image of the measured object on which the second light pattern is projected, calculates an absolute phase value on each the part of the measured object corresponding to each of the pixels; and   a unit that, based on the absolute phase value, calculates three-dimensional coordinates at each the part of the measured object corresponding to each of the pixels.