US2020392376A1PendingUtilityA1

Polishing composition and polishing method

Assignee: FUJIMI INCPriority: Dec 26, 2016Filed: Aug 28, 2020Published: Dec 17, 2020
Est. expiryDec 26, 2036(~10.4 yrs left)· nominal 20-yr term from priority
H10P 52/402H10P 90/129C09K 3/1463C09K 3/1409C09G 1/02B24B 37/044H01L 21/30625
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Claims

Abstract

The present invention provides a solution for preventing the settling of an abrasive while maintaining the polishing performance. In addition, the present invention provides a solution for improving the redispersibility of an abrasive while maintaining the polishing performance. The present invention relates to a polishing composition for use in polishing a semiconductor substrate, the polishing composition containing an abrasive, a layered compound, and a dispersion medium.

Claims

exact text as granted — not AI-modified
1 .- 5 . (canceled) 
     
     
         6 . A polishing method comprising:
 storing a polishing composition for use in polishing a semiconductor substrate, the polishing composition comprising an abrasive, a layered compound, and a dispersion medium, the storing being at a temperature of 10° C. or more for 20 days or more after production; and   polishing a semiconductor substrate using the polishing composition after storage.   
     
     
         7 . The polishing method of  claim 6 , wherein the layered compound is a layered silicate compound. 
     
     
         8 . The polishing method of  claim 6 , wherein an average secondary particle diameter of the abrasive is 1.8 μm or less. 
     
     
         9 . The polishing method of  claim 6 , wherein the semiconductor substrate is a compound semiconductor substrate.

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