Sample Processing Improvements For Microscopy

Abstract

Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.

What is claimed is: 
     
         1 . An apparatus comprising
 a support structure,   a body comprising a body surface and a first pivot feature,   a sample surface supported on the support structure to receive, for microscopy, a sample to be held between the sample surface and the body surface   the support structure comprising a second pivot feature and a guide feature,   the body and the support structure being movable relative to one another about a pivot axis defined when the first pivot feature and the second pivot feature are in contact with one another,   the guide feature configured to limit travel of the body as the body is moved from having the first pivot feature not contacting the second pivot feature to having the first pivot feature contacting the second pivot feature.   
     
     
         2 . The apparatus of  claim 1 , in which the guide feature comprises a post. 
     
     
         3 . The apparatus of  claim 1 , in which the guide feature comprises a wall. 
     
     
         4 . The apparatus of  claim 1 , in which the second pivot feature is configured to limit travel of the body along a first axis, and in which the guide feature is configured to limit travel of the body along a second axis different from the first axis. 
     
     
         5 . The apparatus of  claim 1 , in which the first pivot feature comprises a first edge of the body surface. 
     
     
         6 . The apparatus of  claim 5 , in which points of contact between the first edge of the body surface and the second pivot feature define the pivot axis. 
     
     
         7 . The apparatus of  claim 1  in which the body surface comprises a first edge, the first edge comprising an extended portion and a non-extended portion. 
     
     
         8 . The apparatus of  claim 7 , in which the first edge defines a path for flow of a portion of the sample away from the sample during the relative motion of the body and the support structure. 
     
     
         9 . The apparatus of  claim 1 , in which the sample surface comprises a surface of an imaging sensor. 
     
     
         10 . A method comprising
 locating a sample on a sample surface for microscopy,   moving a body surface into contact with a pivot feature,   pivoting the body surface and the sample surface relative to one another about the pivot feature to constrain the sample between the sample surface and the body surface, and   imaging the sample.   
     
     
         11 . The method of  claim 10  comprising flowing a portion of the sample along a path away from the sample during the relative motion of the body surface and the sample surface. 
     
     
         12 . The method of  claim 10 , in which moving the body surface into contact with the pivot feature comprises
 aligning the body surface in reference to the sample surface by pressing the body surface against a guide feature.   
     
     
         13 . The method of  claim 12  in which the guide feature comprises a post. 
     
     
         14 . The method of  claim 12  in which the guide feature comprises a wall. 
     
     
         15 . The method of  claim 12  in which the guide feature aligns the body surface along a first axis, and in which the pivot feature aligns the body surface along a second axis different from the first axis. 
     
     
         16 . The method of  claim 10  in which locating the sample on the sample surface comprises
 moving the body surface to within 1 mm of the sample surface, and 
 introducing the sample into a space between the sample surface and the body surface while the body surface is within 1 mm of the sample surface.