US2020343102A1PendingUtilityA1

Wafer producing method and wafer producing apparatus

Assignee: DISCO CORPPriority: Nov 16, 2017Filed: Jul 13, 2020Published: Oct 29, 2020
Est. expiryNov 16, 2037(~11.3 yrs left)· nominal 20-yr term from priority
H10P 72/7612H10P 95/04H10D 62/8325B23K 26/53B23K 26/0006B24B 37/00C30B 33/06C30B 29/00B23K 26/60B23K 2101/40B23K 2103/56B23K 26/0884B23K 26/048B23K 26/702B24B 7/228C30B 29/36B24B 7/04B23K 26/032B23K 26/0823B23K 26/00B23K 26/0622H01L 21/0445H01L 21/68742H01L 29/1608H01L 21/32115H10P 54/00H10P 72/10H10P 72/0428H10P 14/3458H10P 90/00
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Claims

Abstract

A method for producing a wafer from a hexagonal single crystal ingot includes: planarizing an upper surface of the hexagonal single crystal ingot; applying a laser beam of such a wavelength as to be transmitted through the ingot, with a focal point positioned in an inside of a region not to be formed with devices of a wafer to be produced from the upper surface of the ingot which has been planarized, to form a production history; and applying a laser beam of such a wavelength as to be transmitted through the hexagonal single crystal ingot with a focal point of the laser beam positioned at a depth corresponding to a thickness of the wafer to be produced from the upper surface of the hexagonal single crystal ingot which has been planarized, to form an exfoliation layer.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A wafer producing apparatus comprising:
 a holding unit adapted to hold a hexagonal single crystal ingot;   a planarizing unit adapted to grind an upper surface of the hexagonal single crystal ingot held by the holding unit to planarize the upper surface;   an exfoliation layer forming unit adapted to apply a laser beam of such a wavelength as to be transmitted through the hexagonal single crystal ingot to the hexagonal single crystal ingot held by the holding unit, with a focal point of the laser beam positioned at a depth corresponding to a thickness of a wafer to the produced from an upper surface of the hexagonal single crystal ingot, to form an exfoliation layer;   a production history forming unit adapted to apply a laser beam of such a wavelength as to be transmitted through the hexagonal single crystal ingot to the hexagonal single crystal ingot, with a focal point of the laser beam positioned in an inside of a region not to be formed with devices of a wafer to be produced, to form a production history;   a wafer exfoliating unit adapted to hold the upper surface of the hexagonal single crystal ingot and exfoliate the wafer from the exfoliation layer; and   a wafer accommodating unit adapted to accommodate the exfoliated wafer.

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