Processing system

Abstract

A processing system comprising a first imaging system configured to capture a first image based on a terahertz wave from an inspection target, a second imaging system configured to capture a second image of the inspection target based on an electromagnetic wave of a wavelength different from the terahertz wave, and a processor configured to process the first image and the second image, wherein the processor detects an inspection region based on the second image and processes information of a region of the first image corresponding to the inspection region.

What is claimed is: 
     
         1 . A processing system comprising:
 a first imaging system configured to capture a first image based on a terahertz wave from an inspection target;   a second imaging system configured to capture a second image of the inspection target based on an electromagnetic wave of a wavelength different from the terahertz wave; and   a processor configured to process the first image and the second image,   wherein the processor detects an inspection region based on the second image and processes information of a region of the first image corresponding to the inspection region.   
     
     
         2 . The system according to  claim 1 , wherein the first imaging system and the second imaging system perform capturing based on terahertz waves of different wavelengths. 
     
     
         3 . The system according to  claim 2 , wherein the processor calculates a difference between the information of the region of the first image corresponding to the inspection region and information of a region of the second image corresponding to the inspection region. 
     
     
         4 . The system according to  claim 1 , wherein the second imaging system performs capturing based on one of visible light, infrared light, and a millimeter wave. 
     
     
         5 . The system according to  claim 1 , wherein the system further comprising a control unit configured to control the first imaging system based on detection of the inspection region. 
     
     
         6 . The system according to  claim 5 , wherein the control unit controls, at least one of a posture of a camera of the first imaging system, a gain of the camera, a capturing range of the camera, an output of the terahertz wave, and a wavelength of the terahertz wave. 
     
     
         7 . The system according to  claim 5 , wherein the system further comprising an environment monitoring unit configured to measure an environment on a periphery,
 wherein the control unit controls at least one of the wavelength and the output of the radiated terahertz wave in accordance with an output of the environment monitoring unit.   
     
     
         8 . The system according to  claim 1 , wherein the system further comprising a plurality of illumination sources for capturing. 
     
     
         9 . The system according to  claim 1 , wherein at least one of the first imaging system and the second imaging system comprises a plurality of cameras for capturing. 
     
     
         10 . The system according to  claim 1 , wherein capturing of the first image, capturing of the second image, and the processing are repetitively performed. 
     
     
         11 . The system according to  claim 1 , wherein the detection of the inspection region is based on one of a shape of the inspection region and information of a spectrum detected from the inspection region. 
     
     
         12 . The system according to  claim 1 , wherein the system further comprising a determination unit configured to determine a risk concerning the inspection target in accordance with an output of the processor. 
     
     
         13 . The system according to  claim 1 , wherein the processor detects the inspection region in the second image based on a learned model learned using at least one of deep learning and machine learning. 
     
     
         14 . A processing system comprising:
 a first imaging system configured to capture a first image based on a terahertz wave from an inspection target;   a second imaging system configured to capture a second image of the inspection target based on an electromagnetic wave of a wavelength different from the terahertz wave;   a control unit configured to control the first imaging system; and   a processor configured to process the second image,   wherein the control unit controls the first imaging system based on a result of the processing performed by the processor for the second image.   
     
     
         15 . The system according to  claim 14 , wherein the control unit controls a condition at the time of capturing of the first image by the first imaging system based on the result of the processing performed by the processor for the second image, and
 the condition includes one or a plurality of conditions selected from a posture of a camera of the first imaging system, zooming of the camera of the first imaging system, an angle of view of the camera of the first imaging system, a gain for the first image, and a range of trimming for the first image.   
     
     
         16 . The system according to  claim 14 , wherein the system further comprising an illumination source configured to radiate the terahertz wave,
 wherein the control unit controls at least one of a wavelength and an output of the terahertz wave radiated from the illumination source based on the result of the processing.   
     
     
         17 . The system according to  claim 14 , wherein the first imaging system and the second imaging system perform capturing based on terahertz waves of different wavelengths. 
     
     
         18 . The system according to  claim 14 , wherein the second imaging system performs capturing based on one of visible light, infrared light, and a millimeter wave. 
     
     
         19 . The system according to  claim 14 , wherein the system further comprising a plurality of illumination sources for capturing. 
     
     
         20 . The system according to  claim 14 , wherein at least one of the first imaging system and the second imaging system comprises a plurality of cameras for capturing. 
     
     
         21 . The system according to  claim 14 , wherein the system further comprising a determination unit configured to determine a risk concerning the inspection target in accordance with an output of the processor. 
     
     
         22 . The system according to  claim 14 , wherein the processor performs the processing for the second image based on a learned model learned using at least one of deep learning and machine learning.