Position and orientation measuring apparatus, information processing apparatus and information processing method
Abstract
There is provided a position and orientation measurement apparatus, information processing apparatus, and an information processing method, capable of performing robust measurement of a position and orientation. In order to achieve the apparatuses and method, at least one coarse position and orientation of a target object is acquired from an image including the target object, at least one candidate position and orientation is newly generated as an initial value used for deriving a position and orientation of the target object based on the acquired coarse position and orientation, and the position and orientation of the target object in the image is derived by using model information of the target object and by performing at least once of fitting processing of the candidate position and orientation generated as the initial value with the target object in the image.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A position and orientation measurement apparatus comprising:
one or more processors; and a memory coupled to the one or more processors, the memory having stored thereon instructions which, when executed by the one or more processors, cause the apparatus to: acquire, from an image including a target object, a plurality of coarse positions and orientations of the target object; determine a resolution of the plurality of coarse positions and orientations of the target object; generate, based on the resolution of the plurality of coarse positions and orientations, a predetermined number of initial candidate positions and orientations including at least one set of position and orientation which is different from any of the acquired coarse positions and orientations; and derive the position and orientation of the target object in the image by associating model information of the target object with respective positions and orientations of the predetermined number of generated initial candidate positions and orientations.Join the waitlist — get patent alerts
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