Substrate processing apparatus
Abstract
A substrate processing apparatus includes: a removing part configured to remove liquid droplets present in a recess; a drain hole located at the bottom of the recess of a nozzle head, and configured to discharge the liquid droplets as a target to be removed out of the recess; and a controller configured to control the discharge state of a gas discharge nozzle such that there is a period in which a gas is discharged from the gas discharge nozzle at a flow rate, at which the gas discharged does not reach a surface to be processed of the substrate, in a period from the end of the rinsing process using a treatment liquid to the start of the drying process using the gas.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A substrate processing apparatus, comprising:
a nozzle head that faces a surface to be processed of a substrate and has a recess with its opening toward the surface to be processed; a treatment liquid supply nozzle provided to the nozzle head and configured to supply a treatment liquid to the surface to be processed; a gas discharge nozzle provided to the nozzle head and configured to discharge a gas to the surface to be processed; a removing part configured to remove liquid droplets present in the recess; a drain part located at a bottom of the recess of the nozzle head, and configured to discharge the liquid droplets as a target to be removed out of the recess, wherein the removing part is a nozzle that is formed to protrude from a surface of the nozzle head, and configured to discharge a gas to the surface to be processed, and the nozzle includes a hole that allows the gas to be discharged toward the recess in a direction perpendicular to discharge direction of the gas.
2 . A substrate processing apparatus, comprising:
a nozzle head that faces a surface to be processed of a substrate and has a recess with its opening toward the surface to be processed; a treatment liquid supply nozzle provided to the nozzle head and configured to supply a treatment liquid to the surface to be processed; a gas discharge nozzle provided to the nozzle head and configured to discharge a gas to the surface to be processed; a removing part configured to remove liquid droplets present in the recess; a drain part located at a bottom of the recess of the nozzle head, and configured to discharge the liquid droplets as a target to be removed out of the recess, wherein the removing part includes a discharge port that is located in a surface of the recess, and configured to discharge a removing material toward the drain part located at the bottom to remove the liquid droplets present in the recess.
3 . The substrate processing apparatus according to claim 1 , further comprising a vibrator configured to vibrate the nozzle head.
4 . The substrate processing apparatus according to claim 1 , further comprising a heater configured to heat the nozzle head.
5 . The substrate processing apparatus according to claim 1 , further comprising a suction part connected to the drain part, and configured to suck liquid droplets of the treatment liquid present in the recess.
6 . The substrate processing apparatus according to claim 1 , wherein a surface of the recess of the nozzle head is roughened to avoid retention of liquid droplets to be removed.
7 . The substrate processing apparatus according to claim 1 , wherein a porous material is applied to a surface of the recess of the nozzle head.
8 . The substrate processing apparatus according to claim 1 , wherein the recess of the nozzle head is made of a porous material.
9 . The substrate processing apparatus according to claim 2 , wherein the discharge port is formed annularly in the surface of the recess.
10 . The substrate processing apparatus according to claim 2 , wherein
the discharge port is located in an upper portion of the recess, and is arranged in an orientation which is perpendicular to a line that connects the discharge port and the drain part with a shortest distance, and the removing material can be discharged along the surface of the recess.
11 . The substrate processing apparatus according to claim 2 , wherein the recess includes a groove that is formed to connect an upper portion of the recess and the drain part with a shortest distance.
12 . The substrate processing apparatus according to claim 2 , wherein the recess includes a groove that is formed in a spiral shape extending from an upper portion of the recess to the drain part.
13 . The substrate processing apparatus according to claim 12 , wherein the groove formed in a spiral shape winds in the same direction as rotation direction of the substrate on which treatment is being performed.Join the waitlist — get patent alerts
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