Inspection apparatus method and apparatus comprising selective frame output
Abstract
A method of operating an inspection device includes collecting a plurality of successive image frames using an image sensor of the inspection device and displaying the plurality of successive image frames on a display of the inspection device. The method includes processing, via a processor of the inspection device, each image frame of the plurality of successive image frames by determining a motion parameter of each respective image frame and adding each respective image frame to a frame buffer when the respective image frame is motion free. The method includes receiving a control signal from a user interface of the inspection device requesting an image frame output. The method further includes determining, via the processor of the inspection device, a noise-reduced image frame from the frame buffer in response to the control signal and outputting the noise-reduced image frame in response to the control signal.
Claims
exact text as granted — not AI-modified1 . An inspection apparatus, comprising:
an image sensor comprising a plurality of pixels, wherein the image sensor is configured to generate image signals based at least in part on light incident on each of the plurality of pixels; a processor communicatively coupled to the image sensor, wherein the processor is programmed to: determine a first image frame corresponding to first image signals generated by the image sensor; determine a second image frame corresponding to second image signals generated by the image sensor; detect a first edge present in the first image frame and the second image frame; align the first edge in the first image frame and the second image frame by offsetting the first image frame, the second image frame, or both; and determine a first super frame after aligning the first edge based at least in part on a sum of the first image frame and the second image frame to facilitate reducing noise in the first super frame compared to the first image frame and the second image frame.
2 . The inspection apparatus of claim 1 , comprising:
a base assembly, wherein the processor is disposed in the base assembly; and an inspection tube coupled to the base assembly at a proximal end and the image sensor at a distal end.
3 . The inspection apparatus of claim 1 , wherein the processor is programmed to:
determine a third image frame corresponding to third image signals generated by the image sensor; determine a second edge present in the third image frame and the first super frame; align the second edge in the third image frame and the first super frame by offsetting the first super frame; and determine a second super frame after aligning the second edge based at least in part on accumulation of the third image frame with the first super frame to facilitate reducing noise in the second super frame compared to the third image frame.
4 . The inspection apparatus of claim 3 , wherein, to align the second edge, the processor is programmed to:
determine a first pixel position of the second edge in the first super frame; determine a second pixel position of the second edge in the third image frame; and offset the first super frame based at least in part on difference between the first pixel position and the second pixel position.
5 . The inspection apparatus of claim 1 , comprising:
a frame buffer communicatively coupled to the processor, wherein the frame buffer is configured to store image data corresponding with the first super frame; and a memory device communicatively coupled to the processor; wherein the processor is programmed to store the image data from the frame buffer to a memory location in the memory device when a save frame control signal is received.
6 . The inspection apparatus of claim 1 , comprising:
a frame buffer communicatively coupled to the processor, wherein the frame buffer is configured to store first image data corresponding with an average image frame; and a display communicatively coupled to the frame buffer; wherein the processor is programmed to: determine the first image data by averaging the first image frame and the second image frame; and instruct the frame buffer to continuously output the first image data to enable the display to continuously display the average image frame.
7 . The inspection apparatus of claim 1 , wherein, to align the first edge, the processor is programmed to:
determine a first pixel position of the first edge in the first image frame; determine a second pixel position of the first edge in the second image frame; and offset only the second image frame based at least in part on difference between the first pixel position and the second pixel position when the second image frame is captured after the first image frame.
8 . The inspection apparatus of claim 1 , wherein the processor is programmed to:
determine a third image frame corresponding to third image signals generated by the image sensor, wherein the first edge is present in the third image frame; align the first edge in the first image frame, the second image frame, the third image frame by offsetting the first image frame, the second image frame, the third image frame, or any combination thereof; and determine the first super frame after aligning the first edge based at least in part on a sum of the first image frame, the second image frame, and the third image frame the second image frame, and the third image frame, or both to facilitate reducing noise in the first super frame compared to the third image frame.
9 . The inspection apparatus of claim 1 , wherein the processor is programmed to:
determine a third image frame corresponding to third image signals generated by the image sensor, wherein the third image signals are generated after the first image signals and the second image signals; determine a fourth image frame corresponding to fourth image signals generated by the image sensor, wherein the fourth image signals are generated after the first image signals and the second image signals; determine a second edge present in the third image frame and the fourth image frame; align the second edge in the third image frame and the fourth image frame by offsetting the third image frame, the fourth image frame, or both; and determine a second super frame after aligning the second edge based at least in part on a sum of the third image frame and the fourth image frame to facilitate reducing noise in the second super frame compared to the third image frame and the fourth image frame.
10 . The inspection apparatus of claim 9 , wherein the processor is programmed to:
determine a third edge present in the first super frame and the second super frame, wherein the second super frame is determined after the first super frame; align the third edge in the first super frame and the second super frame by offsetting the first super frame, the second super frame, or both; and determine a third super frame after aligning the third edge based at least in part on accumulation of the second super frame with the first super frame to facilitate reducing noise in the third super frame compared to the first super frame and the second super frame.
11 . The inspection apparatus of claim 1 , wherein the processor is programmed to:
instruct the image sensor to generate the first image signals and the second image signals at a first brightness level; instruct the image sensor to generate third image signals at a second brightness level different from the first brightness level; determine a third image frame corresponding to the third image signals; and generate a high dynamic range image by utilizing at least a portion of the first super frame and at least a portion of the third image frame, wherein the high dynamic range image comprises more unsaturated pixels than the first super frame.
12 . A remote visual inspection system, comprising:
an imager comprising an array of light-sensitive pixels, wherein the imager is configured to generate image data based at least in part on light level sensed by each pixel in the array of light-sensitive pixels; a processor communicatively coupled to the image sensor, wherein the processor is programmed to: determine a plurality of image frames each based on corresponding image data generated by the image sensor; determine a first baseline image by summing pixel values at a first one or more pixel locations in each of the plurality of image frames; determine a first image frame based on first image data generated by the imager after the first baseline image is determined; determine a first pixel location of a first sharp brightness transition in the first baseline image; determine a second pixel location of the first sharp brightness transition in the first image frame; align the first baseline image with the first image frame when the first pixel location and the second pixel location differ by applying a first rotation of the first baseline image a first translation of the first baseline image, or both on the first image frame; and determine a second baseline image by summing pixel values at a second one or more pixel locations in each of the plurality of image frames and the first image frame after the first baseline image is aligned to facilitate reducing noise in the second baseline image compared to the first image frame and the first baseline image.
13 . The remote visual inspection system of claim 12 , wherein the processor is programmed to:
determine a second image frame based on second image data generated by the imager after the second baseline image is determined; determine a third pixel location of a second sharp brightness transition in the second baseline image; determine a fourth pixel location of the second sharp brightness transition in the second image frame; align the second baseline image with the second image frame when the third pixel location and the fourth pixel location differ by applying a second rotation of the second baseline image, a second translation of the second baseline image, or both on the second image frame; and determine a third baseline image by summing pixel values at a third one or more pixel locations in each of the plurality of image frames, the first image frame, and the second image frame after the second baseline image is aligned to facilitate reducing noise in the third baseline image compared to the second image frame and the second baseline image.
14 . The remote visual inspection system of claim 12 , wherein the processor is programmed to:
instruct the imager to capture the plurality of image frames and the first image frame at a first brightness level; instruct the imager to generate second image data at a second brightness level different from the first brightness level; determine a second image frame based on the second image data; and generate a high dynamic range image by utilizing at least a portion of the second baseline image and at least a portion of the second image frame, wherein the high dynamic range image comprises more unsaturated pixels than the second baseline image.
15 . The remote visual inspection system of claim 12 , wherein the processor is programmed to:
align the first baseline image with the first image frame only when the first pixel location and the second pixel location differ by less than a threshold; and set the first image frame as the second baseline image when the first pixel location and the second pixel location differ by more than the threshold.
16 . The remote visual inspection system of claim 12 , wherein the remote visual inspection system comprises an endoscope, a borescope, a pan-tilt zoom camera, a push camera, or any combination thereof.
17 . A method for operating a remote visual inspection system, comprising:
instructing, using one or more processors, an image sensor of the remote visual inspection system to capture a plurality of image frames at a first brightness level; determining, using the one or more processors, a first super frame by accumulating pixel values in each of the plurality of image frames; instructing, using the one or more processors, the image sensor to capture a first image frame after the plurality of image frames at the first brightness level; detecting, using the one or more processors, whether first movement of the image sensor occurred between capture of the plurality of image frames and capture of the first image frame; and when the first movement of the image sensor is detected: adjusting, using the one or more processors, the first super frame by rotating, translating, or both the first super frame to offset the first movement; and determining, using the one or more processors, a second super frame by accumulating pixel values in each of the plurality of image frames with corresponding pixel values in the first image frame.
18 . The method of claim 17 , comprising:
when the remote visual inspection system receives a freeze frame control signal or a store frame control signal before the first image frame is captured: determining, using the one or more processors, a first average image frame by: summing a first pixel value from each of the plurality of image frames at a first pixel location to determine a first summed pixel value; and dividing the first summed pixel value by number of image frames in the plurality of image frames; and instructing, using one or more processors, a frame buffer of the remote visual inspection system to output first image data corresponding with the first average image frame; and when the remote visual inspection system receives the freeze frame control signal or the store frame control signal after the first image frame is captured: determining, using the one or more processors, a second average image frame by: summing a second pixel value from each of the plurality of image frames and the first image frame at a second pixel location to determine a second summed pixel value; and dividing the second summed pixel value by the number of image frames in the plurality of image frames plus one.
19 . The method of claim 17 , wherein:
detecting whether the first movement of the image sensor occurred comprises: determining a first pixel location in the first super frame at which a physical feature is present; determining a second pixel location in the first image frame at which the physical feature is present; and determining that the first movement occurred when the first pixel location and the second pixel location are different; and adjusting the first image frame comprises rotating, translating, or both the first super frame based at least in part on difference between the first pixel location and the second pixel location.
20 . The method of claim 17 , comprising:
instructing, using one or more processors, the image sensor of the remote visual inspection system to capture a second image frame; detecting, using the one or more processors, whether second movement of the image sensor occurred between capture of the plurality of image frames and capture of the second image frame; and when the second movement of the image sensor is detected: adjusting, using the one or more processors, the second super frame by rotating, translating, or both the second super frame to offset the second movement; determining, using the one or more processors, a third super frame by accumulating pixel values in each of the plurality of image frames with corresponding pixel values in the first image frame and corresponding pixel values in the second image frame when the second image frame is captured at the first brightness level; and determining, using the one or more processors, a high dynamic range image by utilizing at least a portion of the second super frame and at least a portion of the second image frame when the second image frame is captured at a second brightness level different from the first brightness level.Join the waitlist — get patent alerts
Track US2020021738A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.