Response status management in a social networking environment

Abstract

An embodiment of the invention may include a semiconductor structure for ensuring semiconductor design integrity. The semiconductor structure may include an electrical circuit necessary for the operation of the semiconductor circuit and white space having no electrical circuit. The semiconductor structure may include an optical pattern used for validating the semiconductor circuit design formed in the white space of the electrical circuit. In an embodiment of the invention, the optical pattern may include one or more deposition layers. In an embodiment of the invention, the optical pattern may include covershapes. In an embodiment of the invention, the optical pattern may be physically isolated from the electrical circuit. The optical pattern may include a Moiré pattern.

What is claimed is: 
     
         1 . A semiconductor structure comprising:
 an electrical circuit necessary for the operation of the semiconductor circuit, and white space, wherein the white space has no electrical circuit; and   an optical pattern formed in the white space of the electrical circuit, wherein the optical pattern is used for validating the semiconductor circuit design.   
     
     
         2 . The structure of  claim 1 , wherein the optical pattern comprises one or more deposition layers. 
     
     
         3 . The structure of  claim 1 , wherein the optical pattern comprises covershapes. 
     
     
         4 . The structure of  claim 1 , wherein the optical pattern is physically isolated from the electrical circuit. 
     
     
         5 . The structure of  claim 1 , wherein the optical pattern comprises a Moiré pattern.