Vertical gallium nitride schottky diode
Abstract
A vertical Schottky diode includes an ohmic contact, a first epitaxial N-type gallium nitride layer physically contacting the ohmic contact and having a first doping concentration, and a second epitaxial N-type gallium nitride layer physically contacting the first epitaxial N-type gallium nitride layer and having a second doping concentration that is lower than the first doping concentration. The vertical Schottky diode further includes a first edge termination region and a second edge termination region coupled to the second epitaxial N-type gallium nitride layer and separated from each other by a portion of the second epitaxial N-type gallium nitride layer, and a Schottky contact coupled to the portion of the second epitaxial N-type gallium nitride layer, and to the first edge termination region and the second edge termination region.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A vertical Schottky diode comprising:
an ohmic contact; a first epitaxial N-type gallium nitride layer physically contacting the ohmic contact and having a first doping concentration; a second epitaxial N-type gallium nitride layer physically contacting the first epitaxial N-type gallium nitride layer and having a second doping concentration that is lower than the first doping concentration; a first edge termination region and a second edge termination region coupled to the second epitaxial N-type gallium nitride layer and separated from each other by a portion of the second epitaxial N-type gallium nitride layer; and a Schottky contact coupled to the portion of the second epitaxial N-type gallium nitride layer, and to the first edge termination region and the second edge termination region.
2 . The vertical Schottky diode of claim 1 further comprising a metal tab attached to the ohmic contact via a solder.
3 . The vertical Schottky diode of claim 1 wherein the second epitaxial N-type gallium nitride layer has a thickness ranging from about 10 μm to about 25 μm.
4 . The vertical Schottky diode of claim 1 wherein the second epitaxial N-type gallium nitride layer comprises an epitaxial interfacial layer at an interface with the first epitaxial N-type gallium nitride layer.
5 . The vertical Schottky diode of claim 1 wherein the first doping concentration ranges from about 1×10 18 cm −3 to about 5×10 18 cm −3 .
6 . The vertical Schottky diode of claim 5 wherein the second doping concentration ranges from about 2×10 15 cm −3 to about 1×10 16 cm −3 .
7 . The vertical Schottky diode of claim 1 wherein each of the first edge termination region and the second edge termination region comprises gallium nitride doped with magnesium (Mg).
8 . The vertical Schottky diode of claim 1 further comprising a plurality of junction barrier Schottky (JBS) grid regions in the portion of the second epitaxial N-type gallium nitride layer between the first edge termination region and the second edge termination region, the plurality of JBS grid regions being coupled to the Schottky contact.
9 . The vertical Schottky diode of claim 8 wherein each of the plurality of JBS grid regions comprises gallium nitride doped with magnesium (Mg).
10 . The vertical Schottky diode of claim 1 wherein each of the first edge termination region and the second edge termination region comprises a single zone having a third doping concentration ranging from about 2×10 15 cm −3 to about 5×10 16 cm −3 .
11 . The vertical Schottky diode of claim 1 wherein each of the first edge termination region and the second edge termination region comprises a first zone and a second zone, the first zone having a third doping concentration ranging from about 2×10 15 cm −3 to about 5×10 16 cm −3 , and the second zone having a fourth doping concentration ranging from about 5×10 16 cm −3 to about 5×10 17 cm −3 .
12 . A vertical Schottky diode comprising:
a metal tab; an ohmic contact coupled to the metal tab; a first epitaxial N-type gallium nitride layer electrically contacting the ohmic contact and having a first doping concentration; a second epitaxial N-type gallium nitride layer physically contacting the first epitaxial N-type gallium nitride layer and having a second doping concentration that is lower than the first doping concentration; and a Schottky contact coupled to a portion of the second epitaxial N-type gallium nitride layer, the Schottky contact having a step-wise structure such that a cross-section of the Schottky contact is narrower in a region proximal to the second epitaxial N-type gallium nitride layer and wider in a second region distal to the second epitaxial N-type gallium nitride layer.
13 . The vertical Schottky diode of claim 12 wherein the second epitaxial N-type gallium nitride layer has a thickness ranging from about 10 μm to about 25 μm.
14 . The vertical Schottky diode of claim 12 wherein the first doping concentration ranges from about 1×10 18 to about 5×10 18 .
15 . The vertical Schottky diode of claim 14 wherein the second doping concentration ranges from about 2×10 15 to about 1×10 16 .Join the waitlist — get patent alerts
Track US2019334015A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.