US2019252540A1PendingUtilityA1

Semiconductor devices having lower and upper fins and method for fabricating the same

Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Jul 7, 2014Filed: Apr 25, 2019Published: Aug 15, 2019
Est. expiryJul 7, 2034(~7.9 yrs left)· nominal 20-yr term from priority
H01L 29/42392H01L 21/845H01L 27/1211H01L 29/66795H01L 29/785H10D 86/215H10D 86/011H10D 30/6735H10D 30/024H10D 30/62
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Claims

Abstract

Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes a lower fin that protrudes from a substrate and extends in a first direction, an oxide film the lower fin, an upper fin that protrudes from the oxide film and that is spaced apart from the lower fin at a position corresponding to the lower fin, and a gate structure the upper fin that extends in a second direction to intersect the upper fin, wherein germanium (Ge) is included in a portion of the oxide film located between the lower fin and the upper fin.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A semiconductor device comprising:
 a lower fin that protrudes upwardly from a substrate and that extends in a first direction;   an oxide film on the lower fin;   an upper fin that extends in the first direction above the lower fin, the upper fin protruding upwardly from the oxide film and spaced apart from the lower fin; and   a gate structure on the upper fin that extends in a second direction to intersect the upper fin,   wherein germanium (Ge) is included in a portion of the oxide film that is between the lower fin and the upper fin.

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