Projector and control method of projector

Abstract

A projector includes a measurement unit that measures a feature quantity of a first image projected on a projection surface from a position at a first angle relative to the projection surface and generates a first measurement result, a receiving unit that receives a second measurement result obtained by measurement of the feature quantity of the first image in a position at a second angle different from the first angle relative to the projection surface, a determination unit that determines reflection characteristics of the projection surface based on the first measurement result and the second measurement result, a correction unit that corrects first image information and generates second image information based on the reflection characteristics of the projection surface determined by the determination unit, and a projection unit that projects a second image according to the second image information generated by the correction unit on the projection surface.

What is claimed is: 
     
         1 . A projector comprising:
 a measurement unit that measures a feature quantity of a first image projected on a projection surface from a position at a first angle relative to the projection surface and generates a first measurement result;   a receiving unit that receives a second measurement result obtained by measurement of the feature quantity of the first image in a position at a second angle different from the first angle relative to the projection surface;   a determination unit that determines reflection characteristics of the projection surface based on the first measurement result and the second measurement result;   a correction unit that corrects first image information and generates second image information based on the reflection characteristics of the projection surface determined by the determination unit; and   a projection unit that projects a second image according to the second image information generated by the correction unit on the projection surface.   
     
     
         2 . The projector according to  claim 1 , wherein the first measurement result shows a measurement result of measurement of a feature quantity of a measuring object portion contained in the first image from the position at the first angle,
 the second measurement result shows a measurement result of measurement of a feature quantity of the measuring object portion contained in the first image from the position at the second angle, and   a position of the measuring object portion measured from the position at the first angle in the first image is the same as a position of the measuring object portion measured from the position at the second angle in the first image.   
     
     
         3 . The projector according to  claim 1 , wherein the determination unit determines the reflection characteristics of the projection surface from a plurality of candidates of reflection characteristics based on the first measurement result and the second measurement result. 
     
     
         4 . The projector according to  claim 1 , wherein the determination unit obtains a feature quantity of the first image corresponding to a position at an angle between the first angle and the second angle by executing interpolation calculation based on the first measurement result and the second measurement result, and determines the reflection characteristics of the projection surface using the first measurement result, the second measurement result, and the feature quantity of the first image corresponding to the position at the angle between the first angle and the second angle. 
     
     
         5 . The projector according to  claim 1 , further comprising:
 a memory unit that stores the reflection characteristics of the projection surface determined by the determination unit;   an operation unit that receives an operation by a user; and   a reading unit that reads the reflection characteristics of the projection surface from the memory unit when the operation unit receives an operation of reading the reflection characteristics of the projection surface.   
     
     
         6 . The projector according to  claim 1 , wherein the measurement unit is an imaging unit that captures the first image projected on the projection surface from the position at the first angle and generates an imaging result as the first measurement result. 
     
     
         7 . The projector according to  claim 6 , wherein the projection unit projects an image containing an angle detection pattern as the first image,
 further comprising a specification unit that specifies the first angle based on an imaging result of the angle detection pattern by the imaging unit.   
     
     
         8 . The projector according to  claim 7 , wherein the specification unit specifies the first angle based on a degree of deformation of the angle detection pattern shown in the imaging result. 
     
     
         9 . The projector according to  claim 7 , wherein the projection unit projects an image containing the angle detection pattern and a guide image prompting measurement of the angle detection pattern at the second angle as the first image, and
 the receiving unit receives the second measurement result after projection of the image containing the angle detection pattern and the guide image.   
     
     
         10 . A projector comprising:
 a receiving unit that receives a first measurement result obtained by measurement of a feature quantity of a first image projected on a projection surface from a position at a first angle relative to the projection surface and a second measurement result obtained by measurement of the feature quantity of the first image in a position at a second angle different from the first angle relative to the projection surface;   a determination unit that determines reflection characteristics of the projection surface based on the first measurement result and the second measurement result;   a correction unit that corrects first image information and generates second image information based on the reflection characteristics of the projection surface determined by the determination unit; and   a projection unit that projects a second image according to the second image information generated by the correction unit on the projection surface.   
     
     
         11 . A method comprising:
 measuring a feature quantity of a first image projected on a projection surface from a position at a first angle relative to the projection surface and generating a first measurement result;   receiving a second measurement result obtained by measurement of the feature quantity of the first image in a position at a second angle different from the first angle relative to the projection surface;   determining reflection characteristics of the projection surface based on the first measurement result and the second measurement result;   correcting first image information and generating second image information based on the reflection characteristics of the projection surface; and   projecting a second image according to the second image information on the projection surface.