Method and system for fragment assembly and sequence identification
Abstract
Embodiments of a method and/or system for improving fragment assembly and/or sequence identification includes: collecting a sample including a set of nucleic acid components associated with a set of microorganisms; generating a set of tagged sequence fragments; amplifying the set of tagged sequence fragments and sequencing the set of tagged sequence fragments; based upon the set of identifier tags, generating a set of branched assemblies of candidate sequence fragments, wherein each of the set of branched assemblies includes a set of ordered nodes and a set of branches distributed across the set of nodes; implementing a threshold criterion to reduce the set of branched assemblies to a set of branch-reduced assemblies; and identifying a set of sequences corresponding to the set of branch-reduced assemblies and/or generating an analysis informative of the set of microorganisms associated with the sample.
Claims
exact text as granted — not AI-modifiedWe claim:
1 . A method for improving fragment assembly and sequence identification in relation to a set of microorganisms, the method comprising:
collecting a sample including a set of nucleic acid components associated with the set of microorganisms; generating a set of tagged sequence fragments based on a set of identifier tags and a set of sequence fragments derived from the set of nucleic acid components of the sample; sequencing the set of tagged sequence fragments; generating a set of branched assemblies corresponding to candidate sequence fragments, based on the set of identifier tags associated with the sequenced set of tagged sequence fragments, wherein each branched assembly of the set of branched assemblies comprises a set of branches distributed across a set of nodes; implementing a threshold criterion to reduce the set of branched assemblies to a set of branch-reduced assemblies; and identifying a set of microorganism sequences corresponding to the set of branch-reduced assemblies.Join the waitlist — get patent alerts
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