US2019180833A1PendingUtilityA1

Accidental fuse programming protection circuits

Assignee: SKYWORKS SOLUTIONS INCPriority: Nov 2, 2016Filed: Feb 20, 2019Published: Jun 13, 2019
Est. expiryNov 2, 2036(~10.3 yrs left)· nominal 20-yr term from priority
H10W 90/754H10W 74/114H10W 72/5445H10W 72/59H10W 72/90H10W 20/493G11C 17/16G11C 7/24G11C 17/18G11C 17/165H01L 24/05H01L 23/5256H01L 2924/1205H01L 2224/48106H01L 2224/48227H01L 2924/13091H01L 27/11206H01L 23/3121H01L 2924/145H01L 2924/1431H01L 2224/48091H01L 2224/04042H01L 24/48H01L 2224/48229H01L 2924/1427H10B 20/25
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Claims

Abstract

Apparatus and methods for protection against inadvertent programming of fuse cells are provided herein. In certain configurations, a packaged radio frequency module includes a package substrate and a semiconductor die attached to the packaged substrate. The semiconductor die includes a power supply pad, a fuse, a fuse programming transistor having a source electrically connected to the power supply pad and a gate configured to receive a fuse programming signal, a cascode transistor electrically connected between a drain of the fuse programming transistor and the fuse, and a fuse protection capacitor electrically connected between the power supply pad and a gate of the cascode transistor and operable to inhibit unintended programming of the fuse.

Claims

exact text as granted — not AI-modified
1 . A fuse system for a semiconductor die, the fuse system comprising:
 a power supply pad configured to receive a power supply voltage;   a first fuse;   a first fuse programming transistor having a source electrically connected to the power supply pad and a gate configured to receive a fuse programming signal;   a first cascode transistor electrically connected between a drain of the first fuse programming transistor and the first fuse; and   a first fuse protection capacitor electrically connected between the power supply pad and a gate of the first cascode transistor, the first fuse protection capacitor operable to inhibit unintended programming of the first fuse.   
     
     
         2 . The fuse system of  claim 1  further comprising a voltage regulator configured to bias the gate of the first cascode transistor with a regulated voltage. 
     
     
         3 . The fuse system of  claim 2  wherein the voltage regulator generates the regulated voltage based on the power supply voltage, the first fuse protection capacitor operable to prevent accidental programming of the first fuse arising from a delay of the voltage regulator in providing voltage regulation. 
     
     
         4 . The fuse system of  claim 1  further comprising a programming logic circuit configured to generate the fuse programming signal based on a control signal. 
     
     
         5 . The fuse system of  claim 4  further comprising a serial interface configured to provide the control signal to the programming logic circuit to instruct programming of the first fuse. 
     
     
         6 . The fuse system of  claim 4  wherein the programming logic circuit includes a level shifter configured to control the fuse programming signal to a voltage level about equal to the power supply voltage in a first state of the control signal. 
     
     
         7 . The fuse system of  claim 1  further comprising a ground pad configured to receive a ground voltage, the first fuse electrically connected between a drain of the first cascode transistor and the ground pad. 
     
     
         8 . The fuse system of  claim 1  further comprising a plurality of core circuits powered by the power supply voltage from the power supply pad. 
     
     
         9 . The fuse system of  claim 1  further comprising a second fuse, a second fuse programming transistor having a source electrically connected to the power supply pad, and a second cascode transistor electrically connected between a drain of the second fuse programming transistor and the second fuse. 
     
     
         10 . The fuse system of  claim 9  wherein the first fuse programming capacitor is electrically connected between the power supply pad and a gate of the second cascode transistor and operable to inhibit unintended programming of the second fuse. 
     
     
         11 . The fuse system of  claim 9  further comprising a second fuse programming capacitor electrically connected between the power supply pad and a gate of the second cascode transistor and operable to inhibit unintended programming of the second fuse. 
     
     
         12 . The fuse system of  claim 9  further comprising a fuse sensing circuit having a first input electrically connected to the first fuse and a second input electrically connected to the second fuse. 
     
     
         13 . A method of protecting against accidental fuse programming, the method comprising:
 receiving a power supply voltage on a power supply pad of a semiconductor die;   biasing a gate of a fuse programming transistor using a fuse programming signal, the fuse programming transistor having a source electrically connected to the power supply voltage and a drain electrically connected to a fuse through a cascode transistor; and   inhibiting unintended programming of the fuse by adjusting a gate voltage of the cascode transistor using a fuse protection capacitor in response to a change in the power supply voltage, the fuse protection capacitor electrically connected between the power supply pad and a gate of the cascode transistor.   
     
     
         14 . The method of  claim 13  further comprising controlling the gate voltage of the cascode transistor using a regulated voltage from a voltage regulator, and using the fuse protection capacitor to prevent accidental programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation. 
     
     
         15 . The method of  claim 13  further comprising generating the fuse programming signal based on a control signal using a programming logic circuit. 
     
     
         16 . The method of  claim 15  further comprising level shifting the control signal to generate the fuse programming signal, including controlling the fuse programming signal to a voltage level about equal to the power supply voltage in a first state of the control signal. 
     
     
         17 . A packaged radio frequency module comprising:
 a package substrate; and   a semiconductor die attached to the packaged substrate, the semiconductor die including a power supply pad, a fuse, a fuse programming transistor having a source electrically connected to the power supply pad and a gate configured to receive a fuse programming signal, a cascode transistor electrically connected between a drain of the fuse programming transistor and the fuse, and a fuse protection capacitor electrically connected between the power supply pad and a gate of the cascode transistor, the fuse protection capacitor operable to inhibit unintended programming of the fuse.   
     
     
         18 . The packaged radio frequency module of  claim 17  wherein the semiconductor die further includes a voltage regulator configured to bias the gate of the cascode transistor with a regulated voltage, the fuse protection capacitor operable to prevent accidental programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation. 
     
     
         19 . The packaged radio frequency module of  claim 17  wherein the semiconductor die further includes a programming logic circuit configured to generate the fuse programming signal based on a control signal, and a serial interface configured to provide the control signal to the programming logic circuit to instruct programming of the fuse. 
     
     
         20 . The packaged radio frequency module of  claim 17  wherein the semiconductor die further includes a ground pad, the fuse electrically connected between a drain of the cascode transistor and the ground pad.

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