Systems and methods for data collection and prediction of future states of components
Abstract
Systems and methods for data collection and predication of future states of components are disclosed. A system can include a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system. The system can also include a data analysis circuit to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A system for data collection, the system comprising:
a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and a data analysis circuit structured to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.
2 . The system of claim 1 , wherein the data collection band circuit is adapted to alter at least one collection parameter for at least one of the plurality of input sensors.
3 . The system of claim 2 , wherein the at least one collection parameter is a bandwidth parameter.
4 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a multiplexing a plurality of the plurality of input sensors.
5 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.
6 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.
7 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.
8 . The system of claim 1 , wherein the future state corresponds to at least one state selected from a list consisting of: a specified time, a state of a process, a state of a parameter of interest, a state at peak energy consumption, a state at highest temperature value, a state at maximum noise value, and a state when an aspect of system redundancy is at a lowest point.
9 . A method comprising:
interpreting a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and predicting a future state of at least one component based, at least in part, upon the plurality of detection values.
10 . The method of claim 9 , further comprising at least one collection parameter for at least one of the plurality of input sensors.
11 . The method of claim 10 , wherein the at least one collection parameter is a bandwidth parameter.
12 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a multiplexing of a plurality of the plurality of input sensors.
13 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.
14 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.
15 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.
16 . A system for data collection, the system comprising:
a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and a data analysis circuit structured to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.
17 . The system of claim 16 , wherein the data collection band circuit is structured to alter at least one collection parameter for at least one of the plurality of input sensors.
18 . The system of claim 17 , wherein the at least one collection parameter is a bandwidth parameter.
19 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a multiplexing of plurality of the plurality of input sensors.
20 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.
21 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.
22 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.Join the waitlist — get patent alerts
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