"Lead-Free Solder Ball"

Abstract

A lead-free solder ball is provided which suppresses interfacial peeling in a bonding interface of a solder ball, fusion defects which develop between the solder ball and solder paste, and which can be used both with Ni electrodes plated with Au or the like and Cu electrodes having a water-soluble preflux applied atop Cu. The lead-free solder ball for electrodes of BGAs or CSPs consists of 1.6-2.9 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. It has excellent resistance to thermal fatigue and to drop impacts regardless of the type of electrodes of a printed circuit board to which it is bonded, which are Cu electrodes or Ni electrodes having Au plating or Au/Pd plating as surface treatment.

The invention claimed is: 
     
         1 . A lead-free solder ball which is installed for use as an electrode on a rear surface of a module substrate for a BGA or a CSP and which is fused with a solder paste, the solder ball having a solder composition consisting of:
 1.6-2.9 mass % of Ag;   0.7-0.8 mass % of Cu;   0.05-0.08 mass % of Ni;   at least one of:
 at least one of Fe and Co in a total amount of 0.003-0.1 mass %; and 
 Ge in a total amount of 0.003-0.1 mass %; and 
   a remainder of Sn.   
     
     
         2 . The lead-free solder ball as set forth in  claim 1 , wherein the solder composition consists of:
 1.6-2.9 mass % of Ag;   0.7-0.8 mass % of Cu;   0.05-0.08 mass % of Ni;   at least one of Fe and Co in a total amount of 0.003-0.1 mass %; and   a remainder of Sn.   
     
     
         3 . The lead-free solder ball as set forth in  claim 1 , wherein the solder composition consists of:
 1.6-2.9 mass % of Ag;   0.7-0.8 mass % of Cu;   0.05-0.08 mass % of Ni;   Ge in a total amount of 0.003-0.1 mass %; and   a remainder of Sn.   
     
     
         4 . The lead-free solder ball as set forth in  claim 1 , wherein the solder composition consists of:
 1.6-2.9 mass % of Ag;   0.7-0.8 mass % of Cu;   0.05-0.08 mass % of Ni;   at least one of Fe and Co in a total amount of 0.003-0.1 mass %;   Ge in a total amount of 0.003-0.1 mass %; and   a remainder of Sn.   
     
     
         5 . The lead-free solder ball as set forth in  claim 1 , wherein the solder ball has a diameter of at least 0.1 mm. 
     
     
         6 . The lead-free solder ball as set forth in  claim 1 , wherein the solder ball has a diameter of at least 0.3 mm. 
     
     
         7 . The lead-free solder ball as set forth in  claim 1 , wherein the solder ball has a diameter of at least 0.5 mm. 
     
     
         8 . The lead-free solder ball as set forth in  claim 1 , wherein the solder ball develops zero occurrence of fusion defects in a test for fusion defects. 
     
     
         9 . A module substrate for a BGA or a CSP comprising the lead-free solder ball of  claim 1 . 
     
     
         10 . A module substrate for a BGA or a CSP comprising the lead-free solder ball of  claim 2 . 
     
     
         11 . A module substrate for a BGA or a CSP comprising the lead-free solder ball of  claim 3 . 
     
     
         12 . A module substrate for a BGA or a CSP comprising the lead-free solder ball of  claim 4 . 
     
     
         13 . An electronic part comprising a module substrate for a BGA or CSP mounted on a printed circuit board and the lead-free solder ball of  claim 1 . 
     
     
         14 . An electronic part comprising a module substrate for a BGA or CSP mounted on a printed circuit board and the lead-free solder ball of  claim 2 . 
     
     
         15 . An electronic part comprising a module substrate for a BGA or CSP mounted on a printed circuit board and the lead-free solder ball of  claim 3 . 
     
     
         16 . An electronic part comprising a module substrate for a BGA or CSP mounted on a printed circuit board and the lead-free solder ball of  claim 4 .