US2019013214A1PendingUtilityA1

Package structure and manufacturing method thereof

Assignee: POWERTECH TECHNOLOGY INCPriority: Jul 10, 2017Filed: Jul 10, 2017Published: Jan 10, 2019
Est. expiryJul 10, 2037(~11 yrs left)· nominal 20-yr term from priority
H10W 74/00H10W 74/142H10W 90/24H10W 90/754H10W 72/884H10W 72/5363H10W 72/536H10W 72/952H10W 72/59H10W 90/00H10W 72/0198H10W 99/00H10W 72/07504H10W 72/07337H10W 72/073H10W 72/07304H10W 72/354H10W 72/01336H10W 72/01323H10W 90/732H10W 90/721H10W 74/117H10W 74/014H10W 72/9413H10W 72/07554H10W 72/877H10W 72/244H10W 70/655H10W 70/652H10W 90/701H10W 72/00H10P 72/74H10P 72/7436H10W 74/019H10W 70/093H01L 2924/19106H01L 2224/02379H01L 21/568H01L 24/73H01L 21/561H01L 24/13H01L 2224/73265H01L 2924/19105H01L 24/96H01L 2224/95001H01L 2225/0651H01L 2224/04105H01L 25/0657H01L 2224/48227H01L 2225/06562H01L 2224/48091H01L 2224/48111H01L 2224/73253H01L 24/04H01L 2225/0652H01L 2224/02381H01L 2224/13024H01L 24/48
48
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A manufacturing method of a package structure is described. The method includes at least the following steps. A carrier is provided. A semiconductor die and a sacrificial structure are disposed on the carrier. The semiconductor die is electrically connected to the bonding pads on the sacrificial structure through a plurality of conductive wires. As encapsulant is formed on the carrier to encapsulate the semiconductor die, the sacrificial structure and the conductive wires. The carrier is debonded, and at least a portion of the sacrificial structure is removed through a thinning process. A redistribution layer is formed on the semiconductor die and the encapsulant. The redistribution layer is electrically connected to the semiconductor die through the conductive wires.

Claims

exact text as granted — not AI-modified
1 . A manufacturing method of a package structure, comprising:
 providing a carrier,   disposing a semiconductor die and at least one sacrificial structure on the carrier;   electrically connecting the semiconductor die to bonding pads on the sacrificial structure through a plurality of conductive wires;   forming an encapsulant on the carrier to encapsulate the semiconductor die, the sacrificial structure and the conductive wires;   debonding the carrier,   removing at least a portion of the sacrificial structure through a thinning process; and   forming a redistribution layer on the semiconductor die and the encapsulant, the redistribution layer is electrically connected to the semiconductor die through the conductive wires.   
     
     
         2 . The manufacturing method of a package structure according to  claim 1 , wherein the sacrificial structure is disposed on the carrier, and the semiconductor die is disposed on the sacrificial structure. 
     
     
         3 . The manufacturing method of a package structure according to  claim 2 , wherein a width of the sacrificial structure is greater than a width of the semiconductor die. 
     
     
         4 . The manufacturing method of a package structure according to  claim 2 , wherein the redistribution layer is formed on the semiconductor die and the encapsulant after the removal of the sacrificial structure, and a plurality of passive components is disposed on the redistribution layer. 
     
     
         5 . The manufacturing method of a package structure according to  claim 1 , wherein the thinning process removes a portion of the semiconductor die to form a thinned semiconductor die. 
     
     
         6 . The manufacturing method of a package structure according to  claim 1 , wherein the bonding pads or the conductive wires are revealed after the thinning process. 
     
     
         7 . The manufacturing method of a package structure according to  claim 1 , wherein a plurality of the sacrificial structures is disposed on the carrier to surround the semiconductor die. 
     
     
         8 . The manufacturing method of a package structure according to  claim 7 , wherein the semiconductor die and the sacrificial structures are disposed on a same plane and on a same surface of the carriers. 
     
     
         9 . The manufacturing method of a package structure according to  claim 7 , further comprising:
 forming a plurality of passive components on the sacrificial structures, wherein the encapsulant is formed to encapsulate the passive components.   
     
     
         10 . The manufacturing method of a package structure according to  claim 9 , wherein the redistribution layer is formed on the semiconductor die and the encapsulant after the removal of the sacrificial structure, and the redistribution layer is electrically connected to the semiconductor die and the passive components. 
     
     
         11 . A package structure, comprising:
 an encapsulant having a top surface and a bottom surface opposite to the top surface;   a stacked die embedded in the encapsulant;   a plurality of bonding pads of a sacrificial structure encapsulated by the encapsulant, wherein connection terminals of the bonding pads are exposed on a top surface of the encapsulant;   a plurality of conductive wires embedded in the encapsulant, each of the plurality of conductive wires having one end coupled to the stacked die and another end coupled to a terminal of the bonding pads opposite the connection terminals;   a redistribution layer, directly formed on a first surface of the stacked die exposed through the encapsulant, the connection terminals of the bonding pads, and the top surface of the encapsulant, the redistribution layer is electrically connected to the stacked die through the bonding pads and the conductive wires, wherein the connection terminals of the bonding pads, the first surface of the stacked die, and the top surface of the encapsulant are coplanar to each other.   
     
     
         12 . The package structure according to  claim 11 , further comprising at least one passive component embedded in the encapsulant. 
     
     
         13 . The package structure according to  claim 11 , further comprising at least one passive component disposed on the redistribution layer. 
     
     
         14 . The package structure according to  claim 11 , wherein the encapsulant has a first thickness, and the redistribution layer has a second thickness smaller than the first thickness. 
     
     
         15 . The package structure according to  claim 14 , wherein the encapsulant provides a first rigidity, and the redistribution layer provides a second rigidity, the first rigidity is greater than the second rigidity. 
     
     
         16 . (canceled) 
     
     
         17 . The package structure according to  claim 11 , wherein the stacked die comprises:
 a first die having a first surface exposed through the encapsulant;   a second die stacked on the first die opposite to a side of the first surface, the second die cover portions of the first die, and other portions of the first die not covered by the second die contain die pads, the die pads of the first die are electrically connected to the bonding pads through the conductive wires.   
     
     
         18 . The package structure according to  claim 17 , wherein the stacked die further comprises:
 a third die stacked on the second die, the third die cover portions of the second die, and other portions of the second die not covered by the third die contain die pads, the die pads of the second die are electrically connected to the bonding pads through the conductive wires.   
     
     
         19 . The package structure according to  claim 11 , further comprising a plurality of conductive balls disposed on the redistribution layer. 
     
     
         20 . The package structure according to  claim 19 , wherein the bonding pads are arranged with a first pitch and the conductive balls are arranged with a second pitch, the second pitch is greater than the first pitch.

Join the waitlist — get patent alerts

Track US2019013214A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.