US2018341180A1PendingUtilityA1
Target supply device and euv light generation apparatus
Est. expiryApr 28, 2034(~7.8 yrs left)· nominal 20-yr term from priority
H10P 76/00G03F 7/70033H05G 2/006H05G 2/008H01L 21/027H05G 2/002H05G 2/0094
51
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Claims
Abstract
A target supply device may include a tank for storing a target material, a nozzle which is connected to the tank and outputs the target material, and a gas supply section for supplying the tank with gas. The gas supply section may include a booster which is connected to a gas line, boosts the gas supplied from the gas line, and outputs the boosted gas to the tank, a pressure sensor for measuring the pressure inside the tank, and a pressure controller which adjusts the pressure of the gas to be supplied to the tank on the basis of a measurement result from the pressure sensor.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A target supply device configured to supply a target material comprising:
a tank configured to store the target material; a nozzle connected to the tank and configured to output the target material; and a gas supply section configured to supply the tank with gas, the gas supply section comprising: a pipe having a first end connected to the tank; and a booster connected between a gas line and a second end of the pipe and configured to boost gas supplied from the gas line and supply the pipe with the boosted gas.
2 . The target supply device according to claim 1 , wherein the gas supply section further comprises a pressure controller configured to adjust pressure of the boosted gas in the pipe.
3 . The target supply device according to claim 1 , wherein the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
4 . The target supply device according to claim 3 , wherein the gas supply section further comprises a pressure accumulator disposed between the booster and the pressure lowering section.
5 . The target supply device according to claim 1 , wherein the gas supply section further comprises a gas purifying section configured to remove impurities from the gas which has been boosted by the booster.
6 . The target supply device according to claim 5 , wherein the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
7 . The target supply device according to claim 1 , wherein the gas supply section further comprises a particle filter configured to remove particles from the gas which has been boosted by the booster.
8 . The target supply device according to claim 7 , wherein the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
9 . The target supply device according to claim 1 , wherein the gas supply section further comprises a pressure stabilizer configured to stabilize the pressure of the gas which has been boosted by the booster.
10 . The target supply device according to claim 9 , wherein the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
11 . An EUV light generation apparatus comprising a target supply device configured to supply a target material, the EUV light generation apparatus irradiating the target material with a laser beam to generate EUV light, the target supply device comprising:
a tank configured to store the target material; a nozzle connected to the tank and configured to output the target material; and a gas supply section configured to supply the tank with gas, the gas supply section comprising: a pipe having a first end connected to the tank; and a booster connected between a gas line and a second end of the pipe and configured to boost gas supplied from the gas line and supply the pipe with the boosted gas.
12 . The EUV light generation apparatus according to claim 11 , wherein
the gas supply section further comprises a pressure controller configured to adjust pressure of the boosted gas in the pipe.
13 . The EUV light generation apparatus according to claim 11 , wherein
the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
14 . The EUV light generation apparatus according to claim 13 , wherein
the gas supply section further comprises a pressure accumulator disposed between the booster and the pressure lowering section.
15 . The EUV light generation apparatus according to claim 11 , wherein
the gas supply section further comprises a gas purifying section configured to remove impurities from the gas which has been boosted by the booster.
16 . The EUV light generation apparatus according to claim 15 , wherein
the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
17 . The EUV light generation apparatus according to claim 11 , wherein
the gas supply section further comprises a particle filter configured to remove particles from the gas which has been boosted by the booster.
18 . The EUV light generation apparatus according to claim 17 , wherein
the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.
19 . The EUV light generation apparatus according to claim 11 , wherein
the gas supply section further comprises a pressure stabilizer configured to stabilize the pressure of the gas which has been boosted by the booster.
20 . The EUV light generation apparatus according to claim 19 , wherein
the gas supply section further comprises a pressure lowering section configured to lower pressure of the gas, which has been boosted by the booster, down to a predetermined pressure.Join the waitlist — get patent alerts
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