US2018323328A1PendingUtilityA1

Solar cell and method for manufacturing the same

Assignee: LG ELECTRONICS INCPriority: Feb 13, 2009Filed: Jul 12, 2018Published: Nov 8, 2018
Est. expiryFeb 13, 2029(~2.6 yrs left)· nominal 20-yr term from priority
Y02E10/52Y02E10/547H01L 31/1804Y02P70/521H01L 31/0682H01L 31/035281H01L 31/02167H01L 31/03529H01L 31/02168H01L 31/022441H10F 77/315H10F 77/311H10F 71/121H10F 77/219H10F 77/148H10F 77/147H10F 10/146H10F 10/00Y02P70/50
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Claims

Abstract

A solar cell including a semiconductor layer containing first type impurities and having front and back surfaces, a first portion on the back surface of the semiconductor layer, the first portion being doped with second type impurities, a second portion on the back surface of the semiconductor layer, the second portion being more heavily doped with the first type impurities than the semiconductor layer, a third portion on the back surface of the semiconductor layer, the third portion being doped with the first type impurities more heavily than the semiconductor layer and less heavily than the second portion, a passivation layer on the back surface of the semiconductor layer and contacting the first portion, the second portion and the third portion, and having contact holes corresponding to the first portion and the second portion and an anti-reflection layer formed on the front surface of the semiconductor layer.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A solar cell comprising:
 a semiconductor layer containing first type impurities and having a front surface and a back surface, the front surface being a light incident surface on which light is incident;   a first portion on the back surface of the semiconductor layer, the first portion being doped with second type impurities opposite to the first type impurities, and forming a p-n junction with the semiconductor layer;   a second portion on the back surface of the semiconductor layer, the second portion being more heavily doped with the first type impurities than the semiconductor layer;   a third portion on the back surface of the semiconductor layer, the third portion being doped with the first type impurities more heavily than the semiconductor layer and less heavily than the second portion;   a first electrode on the back surface of the semiconductor layer and connected to the first portion;   a second electrode on the back surface of the semiconductor layer and connected to the second portion;   a passivation layer on the back surface of the semiconductor layer and contacting the first portion, the second portion and the third portion, and having contact holes corresponding to the first portion and the second portion; and   an anti-reflection layer formed on the front surface of the semiconductor layer, and including a silicon nitride layer and a silicon dioxide layer.

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