Method and circuit for integrated circuit body biasing

Abstract

The disclosure concerns an integrated circuit comprising: a plurality of circuit domains, each circuit domain comprising: a plurality of transistor devices positioned over p-type and n-type wells, the transistor devices defining one or more data paths of the circuit domain; a monitoring circuit adapted to detect when the slack time of at least one of the data paths in the circuit domain falls below a threshold level and to generate an output signal on an output line based on said detection; and a biasing circuit adapted to modify a biasing voltage of the n-type and/or p-type well of the circuit domain.

1 . An integrated circuit comprising:
 a plurality of circuit domains, each circuit domain including:   p-type and n-type wells;   a plurality of transistor devices positioned over the p-type and n-type wells, the transistor devices defining one or more data paths of the circuit domain;   a monitoring circuit that, in operation, detects when a slack time of at least one of the data paths in the circuit domain falls below a threshold level, and generates an output signal on an output line based on said detection; and   a biasing circuit that, in operation, modifies a biasing voltage of at least one of the n-type or p-type well of the circuit domain, wherein the p-type and n-type wells in each circuit domain comprise a plurality of p-type wells electrically coupled together and a plurality of n-type wells electrically coupled together and said n-type and p-type wells extend across the plurality of circuit domains.   
     
     
         2 . The integrated circuit of  claim 1 , wherein, within each circuit domain, the biasing circuit is coupled to the output line of the monitoring circuit and modifies the biasing voltage based on said output signal. 
     
     
         3 . The integrated circuit of  claim 1 , further comprising a control circuit coupled to the output lines of the monitoring circuits of the plurality of circuit domains, wherein the control circuit is configured to control the biasing circuit of each circuit domain to modify the biasing voltages based on the output signals from each monitoring circuit. 
     
     
         4 . The integrated circuit of  claim 1 , wherein, within each circuit domain, the biasing circuit comprises:
 a well tap coupled to one of the n-type or p-type wells; and   a switch having a plurality of inputs coupled to corresponding supply voltage rails, and an output coupled via the well tap to the one of the n-type or p-type wells, the switch being controlled, in operation, by said output signal to select one of the supply voltage rails to be coupled to the well tap.   
     
     
         5 . The integrated circuit of  claim 1 , wherein the monitoring circuit comprises:
 a flip-flop having a data input coupled to the at least one data path and a clock input configured to receive a clock signal; and   a logic circuit that asserts the output signal if a transition of a data signal in said at least one data path occurs within a first time period of a clock edge of said clock signal.   
     
     
         6 . A method comprising:
 in each circuit domain of a plurality of circuit domains of an integrated circuit that include a plurality of monitoring circuits, respective, and a plurality of biasing circuits, respectively, detecting, by the monitoring circuit in the circuit domain, when a slack time of at least one data path in the circuit domain falls below a threshold level and generating an output signal on an output line based on said detecting, wherein each circuit domain comprises a plurality of transistor devices positioned over p-type and n-type wells, the transistor devices defining one or more data paths of the circuit domain; and   in each circuit domain, modifying, by the biasing circuit of the circuit domain, a biasing voltage of at least one of the n-type wells and p-type wells of the circuit domain, wherein the p-type and n-type wells in each circuit domain comprise a plurality of p-type wells electrically coupled together and a plurality of n-type wells electrically coupled together and said n-type and p-type wells extend across the plurality of circuit domains.   
     
     
         7 . The method of  claim 6 , wherein, within each circuit domain, the biasing circuit modifies the biasing voltage based on said output signal. 
     
     
         8 . The method of  claim 6 , further comprising controlling, using a control circuit coupled to the output lines of the monitoring circuits of the plurality of circuit domains, the biasing circuit of each circuit domain to modify the biasing voltages based on the output signals from each monitoring circuit. 
     
     
         9 . The method of  claim 6 , wherein, within each circuit domain, the biasing circuit comprises a well tap coupled to one of the n-type or p-type wells; and a switch having a plurality of inputs coupled to corresponding supply voltage rails, and an output coupled via the well tap to the one of the n-type or p-type wells, the method further comprising controlling the switch, by said output signal to select one of the supply voltage rails to be coupled to the well tap. 
     
     
         10 . The method of  claim 6 , wherein the monitoring comprises:
 asserting the output signal if a transition of a data signal in the at least one data path occurs within a first time period of a clock edge of a clock signal provided to a flip-flop having a data input coupled to the at least one data path.   
     
     
         11 . An integrated circuit comprising:
 a plurality of circuit domains, each circuit domain including:
 p-type and n-type wells; 
 one or more data paths positioned over the p-type and n-type wells; 
 a monitoring circuit that, in operation, detects when a slack time of at least one of the data paths in the circuit domain falls below a threshold level, and generates an output signal on an output line based on said detection; and 
 a biasing circuit that, in operation, modifies a biasing voltage of at least one of the n-type and p-type wells of the circuit domain based on said output signal, wherein each circuit domain comprises at least one of:
 a p-type well enclosing an n-type well, and 
 an n-type well enclosing a p-type well. 
 
   
     
     
         12 . The integrated circuit of  claim 11 , further comprising a control circuit coupled to the output lines of the monitoring circuits of the plurality of circuit domains, wherein the control circuit is configured to control the biasing circuit of each circuit domain to modify the biasing voltages based on the output signals from each monitoring circuit. 
     
     
         13 . The integrated circuit of  claim 11 , further comprising a plurality of control circuits positioned in the circuit domains, respectively, wherein for each circuit domain, the control circuit is coupled to the output line of the monitoring circuit of the circuit domain, and is configured to control the biasing circuit of the circuit domain to modify the biasing voltage based on the output signal from the monitoring circuit of the circuit domain. 
     
     
         14 . The integrated circuit of  claim 11 , wherein, within each circuit domain, the biasing circuit comprises:
 a well tap coupled to one of the n-type or p-type wells; and   a switch having a plurality of inputs coupled to corresponding supply voltage rails, and an output coupled via the well tap to the one of the n-type or p-type wells, the switch being controlled, in operation, by said output signal to select one of the supply voltage rails to be coupled to the well tap.   
     
     
         15 . The integrated circuit of  claim 11 , wherein the monitoring circuit comprises:
 a flip-flop having a data input coupled to the at least one data path and a clock input configured to receive a clock signal; and   a logic circuit that asserts the output signal if a transition of a data signal in said at least one data path occurs within a first time period of a clock edge of said clock signal.   
     
     
         16 . An integrated circuit comprising:
 a plurality of circuit domains, each circuit domain including:
 p-type and n-type wells; 
 one or more data paths positioned over the p-type and n-type wells; 
 a monitoring circuit that, in operation, detects when a slack time of at least one of the data paths in the circuit domain falls below a threshold level, and generates an output signal on an output line based on said detection; and 
 a biasing circuit that, in operation, modifies a biasing voltage of at least one of the n-type and p-type wells of the circuit domain based on said output signal; and 
   an insulating strip positioned between one or more n-type wells of a first of said circuit domains and one or more n-type wells of a second of said circuit domains, and between one or more p-type wells of the first of said circuit domains and one or more p-type wells of the second of said circuit domains.   
     
     
         17 . The integrated circuit of  claim 16 , further comprising a control circuit coupled to the output lines of the monitoring circuits of the plurality of circuit domains, wherein the control circuit is configured to control the biasing circuit of each circuit domain to modify the biasing voltages based on the output signals from each monitoring circuit. 
     
     
         18 . The integrated circuit of  claim 16 , further comprising a plurality of control circuits positioned in the circuit domains, respectively, wherein for each circuit domain, the control circuit is coupled to the output line of the monitoring circuit of the circuit domain, and is configured to control the biasing circuit of the circuit domain to modify the biasing voltage based on the output signal from the monitoring circuit of the circuit domain. 
     
     
         19 . The integrated circuit of  claim 16 , wherein, within each circuit domain, the biasing circuit comprises:
 a well tap coupled to one of the n-type or p-type wells; and   a switch having a plurality of inputs coupled to corresponding supply voltage rails, and an output coupled via the well tap to the one of the n-type or p-type wells, the switch being controlled, in operation, by said output signal to select one of the supply voltage rails to be coupled to the well tap.   
     
     
         20 . The integrated circuit of  claim 16 , wherein the monitoring circuit comprises:
 a flip-flop having a data input coupled to the at least one data path and a clock input configured to receive a clock signal; and   a logic circuit that asserts the output signal if a transition of a data signal in said at least one data path occurs within a first time period of a clock edge of said clock signal.