Test device

Abstract

A test device includes: a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and detecting a deterioration degree according to a test output value of the deterioration-expected unit circuit; and an interface unit suitable for routing control operation results and test results between the test control unit and the test-subject device during a test operation.

What is claimed is: 
     
         1 . A semiconductor system comprising:
 a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and generating deterioration degrees as analysis result information of different normal operations according to a test output value of the deterioration-expected unit circuit; and   the test-subject device suitable for performing a corresponding one among the different normal operations in response to an output signal of the option control unit.   
     
     
         2 . The semiconductor system of  claim 1 , further comprising:
 an option control unit suitable for replacing a deterioration-confirmed unit circuit of the test-subject device with a replacement unit circuit in response to the analysis result information,   
     
     
         3 . The semiconductor system of  claim 2 , wherein the test-subject device comprises:
 a normal operation unit suitable for performing a predetermined normal operation;   a replacement operation unit suitable for replacing the normal operation unit; and   a selection unit suitable for selectively using the normal operation and the replacement operation unit in response to the analysis result information.   
     
     
         4 . The semiconductor system of  claim 2 , wherein the test control unit comprises:
 a first test driving unit suitable for controlling the test-subject device to perform a normal operation;   a circuit operation detection unit suitable for detecting the operation histories of the plural unit circuits;   a second test driving unit suitable for controlling the deterioration-expected unit circuit to perform a circuit operation, wherein the deterioration-expected unit circuit corresponds to an output signal of the circuit operation detection unit;   a test comparison unit suitable for comparing a test output value of the deterioration-expected unit circuit to an expected value; and   a deterioration detection unit suitable for detecting deterioration degrees of the deterioration-expected unit circuit according to an output signal of the test comparison unit.   
     
     
         5 . The semiconductor system of  claim 1 , wherein the test-subject device alternately activates a plurality of driving units to perform the same operation according to the deterioration degree. 
     
     
         6 . The semiconductor system of  claim 5 , wherein the test-subject device comprises an enable control unit for controlling activation of the plural driving units. 
     
     
         7 . The semiconductor system of  claim 5 , wherein the test control unit comprises:
 a first test driving unit suitable for controlling the test-subject device to perform a normal operation;   a circuit operation detection unit suitable for detecting the operation histories of the plural unit circuits;   a second test driving unit suitable for controlling the deterioration-expected unit circuit to perform a circuit operation, wherein the deterioration-expected unit circuit corresponds to an output signal of the circuit operation detection unit;   a test comparison unit suitable for comparing a test output value of the deterioration-expected unit circuit to an expected value; and   a deterioration detection unit suitable for detecting deterioration degrees of the deterioration-expected unit circuit according to an output signal of the test comparison unit.