US2018284941A1PendingUtilityA1
Information processing apparatus, information processing method, and program
Est. expiryMar 23, 2031(~4.7 yrs left)· nominal 20-yr term from priority
G06F 3/044G06F 1/1626G06F 3/0416G06F 3/0446G06F 3/0445
55
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Claims
Abstract
An information processing apparatus includes a sensor electrode, a detection unit, and a determination unit. The sensor electrode has a capacitance changed in accordance with an operation to an operation surface. The detection unit is configured to detect, based on a change of the capacitance, a displacement of an operation point of the operation surface. The determination unit is configured to determine a press to the operation surface based on a displacement of a capacitance value of the sensor electrode and the displacement of the operation point.
Claims
exact text as granted — not AI-modified1 - 11 . (canceled)
12 . An information processing apparatus, comprising:
a display; a touch panel which includes an x-electrode sensor and a y-electrode sensor that have capacitance changed in accordance with an operation by an operation object made upon or in proximity to an operation surface; and a circuitry configured to
detect, based on change of capacitance, a displacement of a coordinate value of an operation point of the operation surface, wherein the operation point corresponds to a point at which the operation object comes into contact with or comes within a proximity range to the operation surface, and
determine a press to the operation surface based on change of capacitance of at least one of the x-electrode sensor and the y-electrode sensor at the operation point and the displacement of the coordinate value of the operation point.
13 . The information processing apparatus according to claim 12 , wherein the circuitry detects the displacement based on capacitance values of the x-electrode sensor and the y-electrode sensor that have been subjected to signal processing.
14 . The information processing apparatus according to claim 13 , wherein the signal processing comprises a filter processing of the capacitance values of the x-electrode sensor and the y-electrode sensor.
15 . The information processing apparatus according to claim 12 , wherein the circuitry determines the press based on capacitance values of the x-electrode sensor and the y-electrode sensor that have been subjected to signal processing.
16 . The information processing apparatus according to claim 15 , wherein the signal processing comprises a filter processing of the capacitance values of the x-electrode sensor and the y-electrode sensor.
17 . The information processing apparatus according to claim 12 , wherein the circuitry determines the press based on capacitance values of the x-electrode sensor and the y-electrode sensor that have been subjected to signal processing and normalized.
18 . The information processing apparatus according to claim 12 , wherein the x-electrode sensor and the y-electrode sensor are each formed of a transparent material.
19 . The information processing apparatus according to claim 12 , wherein the circuitry is further configured to
execute a predetermined process based on the determined press.
20 . The information processing apparatus according to claim 12 , wherein the circuitry is further configured to determine a plurality of simultaneous presses to the operation surface.
21 . The information processing apparatus according to claim 12 , wherein the circuitry determines the press to the operation surface based on change over a time period of capacitance of at least one of the x-electrode sensor and the y-electrode sensor at the operation point and the displacement of the coordinate value of the operation point.
22 . The information processing apparatus according to claim 12 , wherein the circuitry is further configured to
calculate the coordinate value of the operation point, and determine the press based on a correlation between the change of capacitance and the displacement of the coordinate value.
23 . The information processing apparatus according to claim 22 , wherein the circuitry is further configured to
determine the press based on an inclination of a regression line of a value of the capacitance and the coordinate value.
24 . The information processing apparatus according to claim 22 , wherein the circuitry is further configured to
determine the press based on a correlation coefficient between a value of the capacitance and the coordinate value.
25 . The information processing apparatus according to claim 22 , wherein the circuitry is further configured to
calculate the coordinate value of each of a plurality of operation points, and determine the press at each of the plurality of operation points.
26 . An information processing method, comprising:
detecting a displacement of a coordinate value of an operation point of an operation surface of a touch panel, based on capacitance of an x-electrode sensor and a y-electrode sensor that change in accordance with an operation by the operation object made upon or in proximity to the operation surface, wherein the operation point corresponds to a point at which the operation object comes into contact with or comes within a proximity range to the operation surface; and determining a press to the operation surface based on change of capacitance of at least one of the x-electrode sensor and the y-electrode sensor at the operation point and the displacement of the coordinate value of the operation point.
27 . A non-transitory computer-readable medium having embodied thereon a program, which when executed by a computer causes the computer to execute a method, the method comprising:
detecting a displacement of a coordinate value of an operation point of an operation surface of a touch panel, based on capacitance of an x-electrode sensor and a y-electrode sensor that change in accordance with an operation by the operation object made upon or in proximity to the operation surface, wherein the operation point corresponds to a point at which the operation object comes into contact with or comes within a proximity range to the operation surface; and determining a press to the operation surface based on change of capacitance of at least one of the x-electrode sensor and the y-electrode sensor at the operation point and the displacement of the coordinate value of the operation point.Join the waitlist — get patent alerts
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