US2018282891A1PendingUtilityA1

Copper sulfate, copper sulfate solution, plating solution, method for producing copper sulfate, method for producing semiconductor circuit board, and method for producing electronic apparatus

Assignee: JX NIPPON MINING & METALS CORPPriority: Mar 31, 2017Filed: Mar 30, 2018Published: Oct 4, 2018
Est. expiryMar 31, 2037(~10.7 yrs left)· nominal 20-yr term from priority
H10P 14/47H10W 20/4421C25D 3/38C25D 7/12C25D 7/123C01P 2006/80C01G 3/10
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Claims

Abstract

Copper sulfate which includes an Al with a concentration of 0.08 ppm by mass or less.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . Copper sulfate comprising an Al with a concentration of 0.08 ppm by mass or less. 
     
     
         2 . The copper sulfate according to  claim 1 , wherein the copper sulfate further comprises any one, any two, any three, or four of the following items (3-1) to (3-4):
 (3-1) an In with a concentration of 1.0 ppm by mass or less,   (3-2) a Tl with a concentration of 0.05 ppm by mass or less,   (3-3) a Sn with a concentration of 1.0 ppm by mass or less, and   (3-4) an Ag with a concentration of 1.0 ppm by mass or less.   
     
     
         3 . The copper sulfate according to  claim 1 , wherein the copper sulfate further comprises any one, any two, any three, or four of the following items (4-1) to (4-4):
 (4-1) an In with a concentration of 0.5 ppm by mass or less,   (4-2) a Tl with a concentration of 0.05 ppm by mass or less,   (4-3) a Sn with a concentration of 0.5 ppm by mass or less, and   (4-4) an Ag with a concentration of 0.8 ppm by mass or less.   
     
     
         4 . The copper sulfate according to  claim 1 , wherein the copper sulfate further comprises any one, any two, any three, or four of the following items (5-1) to (5-4):
 (5-1) an In with a concentration of 0.2 ppm by mass or less,   (5-2) a Tl with a concentration of 0.05 ppm by mass or less,   (5-3) a Sn with a concentration of 0.2 ppm by mass or less, and   (5-4) an Ag with a concentration of 0.3 ppm by mass or less.   
     
     
         5 . The copper sulfate according to  claim 1 , wherein the copper sulfate has a concentration of copper sulfate of 99.9% by mass or more and 99.999% by mass or less. 
     
     
         6 . The copper sulfate according to  claim 5 , wherein the copper sulfate has a concentration of copper sulfate of 99.995% by mass or less. 
     
     
         7 . The copper sulfate according to  claim 1 , wherein the copper sulfate has a concentration of copper sulfate of 99.9% by mass or more and 99.99% by mass or less and a concentration of metal impurities other than Cu of 30 ppm by mass or less in total. 
     
     
         8 . The copper sulfate according to  claim 1 , wherein the copper sulfate has a total organic carbon concentration of 10 ppm by mass or less. 
     
     
         9 . A copper sulfate solution comprising the copper sulfate according to  claim 1 . 
     
     
         10 . A method for producing copper sulfate comprising:
 concentrating by heating a copper sulfate raw material solution obtained by dissolving a copper raw material in concentrated sulfuric acid; and   
       cooling the copper sulfate raw material solution after concentrating by heating, until a temperature of the copper sulfate raw material solution becomes 25° C., at a cooling rate of 15° C./hr or less, so as to deposit crystals of copper sulfate pentahydrate. 
     
     
         11 . A plating solution comprising an Al with a concentration of 0.018 ppm by mass or less. 
     
     
         12 . The plating solution according to  claim 11 , wherein the plating solution further comprises any one, any two, any three, or four of the following items (20-1) to (20-4):
 (20-1) an In with a concentration of 0.23 ppm by mass or less,   (20-2) a Tl with a concentration of 0.01 ppm by mass or less,   (20-3) a Sn with a concentration of 0.23 ppm by mass or less, and   (20-4) an Ag with a concentration of 0.23 ppm by mass or less.   
     
     
         13 . The plating solution according to  claim 11 , wherein the plating solution further comprises any one, any two, any three, or four of the following items (21-1) to (21-4):
 (21-1) an In with a concentration of 0.01 ppm by mass or less,   (21-2) a Tl with a concentration of 0.01 ppm by mass or less,   (21-3) a Sn with a concentration of 0.01 ppm by mass or less, and   (21-4) an Ag with a concentration of 0.01 ppm by mass or less.   
     
     
         14 . The plating solution according to  claim 11 , wherein the plating solution has a copper concentration of from 50 to 100 g/L. 
     
     
         15 . The plating solution according to  claim 11 , wherein the plating solution comprises a copper concentration of from 50 to 90 g/L. 
     
     
         16 . A method for producing a semiconductor circuit board comprising performing copper plating by using the plating solution according to  claim 11 . 
     
     
         17 . A method for producing an electronic apparatus comprising producing an electronic apparatus by using a semiconductor circuit board produced by the method for producing a semiconductor circuit board according to  claim 16 .

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