US2018275344A1PendingUtilityA1
Sacrificial grating coupler for testing v-grooved integrated circuits
Est. expiryJun 30, 2036(~9.9 yrs left)· nominal 20-yr term from priority
G02B 6/305G02B 6/423G02B 6/34G02B 6/136G02B 2006/12061G02B 2006/12107
57
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Embodiments are directed to a method of forming an optical coupler system. The method includes forming at least one waveguide over a substrate, and forming a sacrificial optical coupler in a first region over the substrate. The method further includes configuring the sacrificial optical coupler to couple optical signals to or from the at least one waveguide, and forming a v-groove in the first region over the substrate, wherein forming the v-groove includes removing the sacrificial optical coupler from the first region.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An optical coupler system comprising:
at least one waveguide formed over a substrate; and a sacrificial optical coupler formed in a first region over the substrate; wherein the sacrificial optical coupler is configured to couple optical signals to or from the at least one waveguide; wherein the first region defines an area in which a v-groove will be formed during a subsequent fabrication operation of the optical coupler system.
2 . The system of claim 1 , wherein the subsequent fabrication operation comprises one or more etch operations.
3 . The system of claim 1 , wherein the sacrificial optical coupler comprises a sacrificial grating coupler.
4 . The system of claim 1 , wherein the sacrificial optical coupler is configured to couple optical signals to or from an optical fiber.
5 . The system of claim 1 , wherein the sacrificial optical coupler is configured to perform a test operation comprising coupling optical signals through the sacrificial optical coupler to or from the at least one waveguide.
6 . The system of claim 5 further comprising at least one optoelectronic component formed over the substrate.
7 . The system of claim 6 further comprising the at least one waveguide coupled to the at least one optoelectronic component.
8 . The system of claims 7 , wherein the test operation further comprises coupling optical signals through the at least one waveguide to or from the at least one optoelectronic component.
9 . The system of claim 1 , wherein the v-groove is configured to couple optical signals to or from the at least one waveguide.
10 . The system of claim 9 , wherein an optical fiber is coupled to the v-groove.
11 . The system of claim 10 , wherein the v-groove is configured to couple optical signals to or from the optical fiber.
12 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched silicon gratings formed in a silicon-on-insulator (SOI) layer.
13 . The system of claim 1 , wherein the sacrificial optical coupler comprises partially etched gratings formed in a silicon-on-insulator (SOI) layer.
14 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched polysilicon gratings formed in a polysilicon gate layer.
15 . The system of claim 1 , wherein the sacrificial optical coupler comprises fully etched silicon nitride gratings.
16 . An optical coupler system comprising:
at least one waveguide formed over a substrate; and sacrificial gratings formed in a first region over the substrate; wherein the sacrificial gratings are configured to couple optical signals to or from the at least one waveguide; wherein the first region defines an area in which a v-groove will be formed during a subsequent fabrication operation of the optical coupler system.
17 . The system of claims 16 , wherein the subsequent fabrication operation comprises one or more etch operations.
18 . The system of claim 17 , wherein the v-groove is configured to couple optical signals to or from the at least one waveguide.
19 . The system of claim 18 , wherein the v-groove is further configured to couple optical signals to or from an optical fiber.
20 . The system of claim 16 further comprising:
at least one optoelectronic component formed over the substrate; and
the at least one waveguide coupled to the at least one optoelectronic component;
wherein the sacrificial gratings are configured to perform a test operation comprising coupling optical signals through the sacrificial gratings to or from the at least one waveguide;
wherein the test operation further comprises coupling optical signals through the at least one waveguide to or from the at least one optoelectronic component.Join the waitlist — get patent alerts
Track US2018275344A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.