US2018275077A1PendingUtilityA1

Radiography and Computed Tomography with High-Energy Electron Beams

Assignee: UNIV LOMA LINDAPriority: Jun 16, 2014Filed: May 15, 2018Published: Sep 27, 2018
Est. expiryJun 16, 2034(~7.9 yrs left)· nominal 20-yr term from priority
G06T 2207/30036G06T 2207/30084A61B 6/5205A61B 6/4258A61B 6/501A61B 6/032G01N 23/046A61B 6/503G06T 2207/30061G01N 2223/102A61B 6/502G06T 2207/30016G06T 2207/30068G06T 7/0012G06T 2207/10028G06T 2207/30048G06T 2207/10081G06T 12/20G06T 12/00G06T 11/003A61B 6/14G06T 11/006A61B 6/51
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Claims

Abstract

An imaging system can use high-energy electrons at a low dose level to generate 3D computed tomography images and/or 2D radiographic images of living tissue and other objects. In some embodiments, a nozzle directs a source of high-energy electrons to the imaging target, and a detector system detects physical quantities of electrons that interact with the imaging target. In some embodiments, a computer system can calculate estimated paths taken by individual electrons within the imaging target, determine interactions between voxels of a digitized image of the imaging target and individual electrons, and reconstruct a digitized image of the imaging target based at least in part on the determined interactions between individual electrons and voxels. The imaging target can include but is not limited to living tissue, humans, pediatric patients, small animals, and other objects, such as those used in industrial applications.

Claims

exact text as granted — not AI-modified
What is claimed: 
     
         1 . An imaging system for generating images of an object, the system comprising:
 a source of high-energy electrons configured to emit electrons with an energy greater than or equal to MeV;   a nozzle that directs the electrons emitted by the source towards the object when the system is in operation;   a detector configured to detect at least a position of the electrons before and after the electrons interact with the object; and   a processor configured to calculate an estimated path corresponding to an actual path taken by an individual electron within the object based at least in part on a detected position of the individual electron.

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