Power field-effect transistor (fet), pre-driver, controller, and sense resistor integration for multi-phase power applications
Abstract
Techniques are described for integrating power field-effect transistors (FETs), pre-drivers, controllers, and/or resistors into a common multi-chip package for implementing multi-phase bridge circuits. The techniques may provide a multi-chip package with at least two high-side (HS) FETs and at least two low-side (LS) FETs, and place the at least two HS FETs or the at least LS FETs on a common die. Placing at least two FETs on a common die may reduce the number of die and the number of thermal pads (i.e., die pads) needed to implement a set of power FETs, thereby decreasing component count of a multi-phase bridge circuit and/or allowing a more compact, higher current density multi-phase bridge circuit to be obtained without significantly increasing thermal power dissipation of the circuit.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A multi-chip package comprising:
at least two low-side (LS) field-effect transistors (FETs); at least two high-side (HS) FETs; and a die including the at least two HS FETs or the at least two LS FETs.
2 . The multi-chip package of claim 1 ,
wherein the die is a first die that includes the at least two HS FETs, wherein the multi-chip package further comprises: a second die that includes a first LS FET of the at least two LS FETs; and a third die that includes a second LS FET of the at least two LS FETs.
3 . The multi-chip package of claim 2 , further comprising:
a fourth die that includes at least one of a controller circuit or a driver circuit.
4 . The multi-chip package of claim 3 , further comprising:
a first resistor coupled to a source electrode of the first LS FET; and a second resistor coupled to a source electrode of the second LS FET.
5 . The multi-chip package of claim 1 , wherein the die is a first die that includes the at least two HS FETs, wherein the multi-chip package further comprises:
a second die that that includes at least one of the two LS FETs.
6 . The multi-chip package of claim 5 , further comprising:
a thermal pad; a third die that includes at least one of a controller circuit or a driver circuit; wherein the second die and the third die are disposed on the thermal pad.
7 . The multi-chip package of claim 6 , wherein the second die includes at least two of the LS FETS.
8 . The multi-chip package of claim 6 , wherein the at least two HS FETs are drain substrate HS FETs, and wherein the at least two LS FETs are source substrate LS FETs.
9 . The multi-chip package of claim 1 , wherein the die is a first die that includes the at least two HS FETs, and wherein the at least two HS FETs are drain substrate HS FETs.
10 . The multi-chip package of claim 1 , wherein the die is a first die that includes the at least two LS FETs, and wherein the multi-chip package further comprises:
a second die that includes a first HS FET of the at least two HS FETs; and a third die that includes a second HS FET of the at least two HS FETs, wherein the second and third dies are vertically-stacked on top of the first die.
11 . The multi-chip package of claim 10 , further comprising:
a first clip positioned between the first die and the second die and coupled to a drain electrode of the a first LS FET of the at least two LS FETs, and to a source electrode of the first HS FET; and a second clip positioned between the first die and the third die and coupled to a drain electrode of the a second LS FET of the at least two LS FETs, and to a source electrode of the second HS FET.
12 . The multi-chip package of claim 10 , further comprising:
a fourth die that includes at least one of a controller circuit or a driver circuit.
13 . The multi-chip package of claim 10 , further comprising:
a first resistor coupled to a drain electrode of the first HS FET; and a second resistor coupled to a drain electrode of the second HS FET.
14 . The multi-chip package of claim 1 , wherein the die is a first die that includes the at least two LS FETs, wherein the multi-chip package further comprises:
a second die that includes the at least two HS FETs, wherein the second die is vertically-stacked on top of the first die.
15 . The multi-chip package of claim 14 , further comprising:
a third die that includes at least one of a controller circuit or a driver circuit.
16 . The multi-chip package of claim 14 , further comprising:
a resistor coupled to a drain electrode of the first and second HS FETs.
17 . The multi-chip package of claim 1 , wherein the die is a first die that includes the at least two LS FETs, wherein the multi-chip package further comprises:
a thermal pad; a second die that includes at least one of the least two HS FETs, wherein the second die is vertically-stacked on top of the first die; and a third die that includes at least one of a controller circuit or a driver circuit, wherein the first die and the third die are disposed on the thermal pad.
18 . The multi-chip package of claim 17 , wherein the second die includes the at least two HS FETs.
19 . A multi-chip package comprising:
at least two low-side (LS) field-effect transistors (FETs); at least two high-side (HS) FETs; a first die including the at least two HS FETs or the at least two LS FETs; and a second die including at least one of a controller circuit or a driver circuit.
20 . A multi-chip package comprising:
at least two low-side (LS) field-effect transistors (FETs); at least two high-side (HS) FETs; a first die including the at least two HS FETs or the at least two LS FETs; a second die including at least one of a controller circuit or a driver circuit; and a first resistor coupled to a first one of the at least two HS FETs or the at least two LS FETs; and a second resistor coupled to a second one of the at least two HS FETs or the at least two LS FETs.Join the waitlist — get patent alerts
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